scholarly journals Structural characterization of porous GaN distributed Bragg reflectors using x-ray diffraction

2019 ◽  
Vol 126 (21) ◽  
pp. 213109 ◽  
Author(s):  
P. H. Griffin ◽  
M. Frentrup ◽  
T. Zhu ◽  
M. E. Vickers ◽  
R. A. Oliver
Keyword(s):  
Structural Characterization ◽  
Bragg Reflectors ◽  
Distributed Bragg Reflectors ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

1997 ◽  
Vol 306 (2) ◽  
pp. 198-204 ◽  
Author(s):  
A.A. Darhuber ◽  
J. Stangl ◽  
V. Holy ◽  
G. Bauer ◽  
A. Krost ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled

AlxGa1-xN-Based Materials and Heterostructures

1996 ◽  
Vol 449 ◽  
Author(s):  
P. Kung ◽  
A. Saxler ◽  
D. Walker ◽  
X. Zhang ◽  
R. Lavado ◽  
...  
Keyword(s):  
Chemical Vapor ◽  
Bragg Reflectors ◽  
X Ray Diffraction ◽  
Chemical Vapor Deposition Growth ◽  
X Ray ◽  
Sapphire Substrates ◽  
Transmission Electron ◽  
Dimensional Electron Gas ◽  
P Type

ABSTRACTWe present the metalorganic chemical vapor deposition growth, n-type and p-type doping and characterization of AlxGa1-xN alloys on sapphire substrates. We report the fabrication of Bragg reflectors and the demonstration of two dimensional electron gas structures using AlxGa1-xN high quality films. We report the structural characterization of the AlxGa1-xN / GaN multilayer structures and superlattices through X-ray diffraction and transmission electron microscopy. A density of screw and mixed threading dislocations as low as 107 cm-2 was estimated in AlxGa1-xN / GaN structures. The realization of AlxGa1-xN based UV photodetectors with tailored cut-off wavelengths from 365 to 200 nm are presented.

Structural characterization of the CeO2/Gd2O3 mixed system by synchrotron X-ray diffraction

2012 ◽  
Vol 190 ◽  
pp. 24-28 ◽  
Author(s):  
Cristina Artini ◽  
Giorgio A. Costa ◽  
Marcella Pani ◽  
Andrea Lausi ◽  
Jasper Plaisier
Keyword(s):  
Structural Characterization ◽  
Mixed System ◽  
X Ray Diffraction ◽  
X Ray
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