Measurement of avalanche multiplication utilizing Franz-Keldysh effect in GaN p-n junction diodes with double-side-depleted shallow bevel termination
2019 ◽
2014 ◽
Vol 24
(9)
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pp. 646-648
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2004 ◽
Vol 34
(2b)
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pp. 663-665
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Keyword(s):
2019 ◽
Vol 66
(1)
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pp. 264-270
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1980 ◽
Vol 16
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pp. 89-93
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2005 ◽
Vol 59
(8)
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pp. 483-485