scholarly journals Nanoscale n++-p junction formation in GeOI probed by tip-enhanced Raman spectroscopy and conductive atomic force microscopy

2019 ◽  
Vol 125 (24) ◽  
pp. 245703 ◽  
Author(s):  
Slawomir Prucnal ◽  
Yonder Berencén ◽  
Mao Wang ◽  
Yordan M. Georgiev ◽  
Artur Erbe ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Junction Formation ◽  
Tip Enhanced Raman Spectroscopy

Atomic Force Microscopy Based Top-Illumination Electrochemical Tip-Enhanced Raman Spectroscopy

2020 ◽  
Vol 92 (18) ◽  
pp. 12548-12555 ◽  
Author(s):  
Yi-Fan Bao ◽  
Mao-Feng Cao ◽  
Si-Si Wu ◽  
Teng-Xiang Huang ◽  
Zhi-Cong Zeng ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy

Atomic Force Microscopy with Raman and Tip-Enhanced Raman Spectroscopy

2012 ◽  
Vol 20 (6) ◽  
pp. 22-27 ◽  
Author(s):  
Stefan B. Kaemmer ◽  
Ton Ruiter ◽  
Bede Pittenger
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Surface Properties ◽  
Complementary Information ◽  
Combined System ◽  
Force Microscopy ◽  
Additional Information ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy

Both atomic force microscopy (AFM) and Raman spectroscopy are techniques used to gather information about the surface properties of a sample. There are many reasons to combine these two technologies, and this article looks both at the complementary information gained from the techniques and how a researcher having access to a combined system can benefit from the additional information available.

scholarly journals Atomic Force Microscopy Based Tip-Enhanced Raman Spectroscopy in Biology

2018 ◽  
Vol 19 (4) ◽  
pp. 1193 ◽  
Author(s):  
Lizhen Gao ◽  
Huiling Zhao ◽  
Tianfeng Li ◽  
Peipei Huo ◽  
Dong Chen ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy

Uniformity of Epitaxial Graphene on On-Axis and Off-Axis SiC Probed by Raman Spectroscopy and Nanoscale Current Mapping

2010 ◽  
Vol 645-648 ◽  
pp. 607-610 ◽  
Author(s):  
Sushant Sonde ◽  
Filippo Giannazzo ◽  
Jean Roch Huntzinger ◽  
Antoine Tiberj ◽  
Mikael Syväjärvi ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Solid State ◽  
Epitaxial Graphene ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Micro Raman Spectroscopy ◽  
Combined Application ◽  
Atomic Force ◽  
Miscut Angle

Epitaxial graphene was grown on the surface of on-axis and off-axis SiC (0001) by solid state graphitization at high temperatures (2000 °C) in Ar ambient. The effect of the miscut angle on the lateral uniformity of the few layers of graphene (FLG) was investigated by combined application of micro-Raman spectroscopy and Torsion Resonance Conductive Atomic Force Microscopy, the latter method enabling a quantification of the FLG coverage on SiC with submicrometer lateral resolution. While the on-axis samples result in uniform coverage by thin (~ 3 monolayers) FLG, the coverage for off-axis samples is much less uniform, following closely the step bunching morphology of the SiC surface.

scholarly journals Tip Recycling for Atomic Force Microscopy-Based Tip-Enhanced Raman Spectroscopy

2020 ◽  
Vol 74 (11) ◽  
pp. 1358-1364
Author(s):  
Giovanni Luca Bartolomeo ◽  
Guillaume Goubert ◽  
Renato Zenobi
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Visible Range ◽  
Chemical Information ◽  
Plasmonic Enhancement ◽  
Single Experiment ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy ◽  
Reducing Costs

Tip-enhanced Raman spectroscopy (TERS) is a powerful tool for the characterization of surfaces and two-dimensional materials, delivering both topographical and chemical information with nanometer-scale spatial resolution. Atomic force microscopy (AFM)–TERS combines AFM with a Raman spectrometer and is a very versatile technique, capable of working in vacuum, air, and liquid, and on a variety of different samples. A metalized AFM tip is necessary in order to take advantage of the plasmonic enhancement. The most commonly used metal is Ag, thanks to its high plasmonic activity in the visible range. Unfortunately, though, the tip metallization process is still challenging and not fully reliable, yielding inconsistent enhancement factors even within the same batch of tips; as a consequence, many tips are usually prepared at once (for a single experiment), to ensure that at least one of them is sufficiently active. As the lifetime of an unprotected, Ag-coated plasmonic probe is only a few hours, the procedure is inefficient and results in a substantial waste of materials and money. In this work, we establish a cleaning routine to effectively re-use Ag-coated AFM–TERS probes, drastically reducing costs without compromising the quality of the experimental results.

Compact metal probes: A solution for atomic force microscopy based tip-enhanced Raman spectroscopy

2012 ◽  
Vol 83 (12) ◽  
pp. 123708 ◽  
Author(s):  
R. D. Rodriguez ◽  
E. Sheremet ◽  
S. Müller ◽  
O. D. Gordan ◽  
A. Villabona ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy
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