Toward High-Contrast Atomic Force Microscopy-Tip-Enhanced Raman Spectroscopy Imaging: Nanoantenna-Mediated Remote-Excitation on Sharp-Tip Silver Nanowire Probes

Nano Letters ◽  
2018 ◽  
Vol 19 (1) ◽  
pp. 100-107 ◽  
Author(s):  
Xuezhi Ma ◽  
Yangzhi Zhu ◽  
Ning Yu ◽  
Sanggon Kim ◽  
Qiushi Liu ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Silver Nanowire ◽  
High Contrast ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy

Atomic Force Microscopy Based Top-Illumination Electrochemical Tip-Enhanced Raman Spectroscopy

2020 ◽  
Vol 92 (18) ◽  
pp. 12548-12555 ◽  
Author(s):  
Yi-Fan Bao ◽  
Mao-Feng Cao ◽  
Si-Si Wu ◽  
Teng-Xiang Huang ◽  
Zhi-Cong Zeng ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy

Atomic Force Microscopy with Raman and Tip-Enhanced Raman Spectroscopy

2012 ◽  
Vol 20 (6) ◽  
pp. 22-27 ◽  
Author(s):  
Stefan B. Kaemmer ◽  
Ton Ruiter ◽  
Bede Pittenger
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Surface Properties ◽  
Complementary Information ◽  
Combined System ◽  
Force Microscopy ◽  
Additional Information ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy

Both atomic force microscopy (AFM) and Raman spectroscopy are techniques used to gather information about the surface properties of a sample. There are many reasons to combine these two technologies, and this article looks both at the complementary information gained from the techniques and how a researcher having access to a combined system can benefit from the additional information available.

scholarly journals Atomic Force Microscopy Based Tip-Enhanced Raman Spectroscopy in Biology

2018 ◽  
Vol 19 (4) ◽  
pp. 1193 ◽  
Author(s):  
Lizhen Gao ◽  
Huiling Zhao ◽  
Tianfeng Li ◽  
Peipei Huo ◽  
Dong Chen ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy

scholarly journals Tip Recycling for Atomic Force Microscopy-Based Tip-Enhanced Raman Spectroscopy

2020 ◽  
Vol 74 (11) ◽  
pp. 1358-1364
Author(s):  
Giovanni Luca Bartolomeo ◽  
Guillaume Goubert ◽  
Renato Zenobi
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Visible Range ◽  
Chemical Information ◽  
Plasmonic Enhancement ◽  
Single Experiment ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy ◽  
Reducing Costs

Tip-enhanced Raman spectroscopy (TERS) is a powerful tool for the characterization of surfaces and two-dimensional materials, delivering both topographical and chemical information with nanometer-scale spatial resolution. Atomic force microscopy (AFM)–TERS combines AFM with a Raman spectrometer and is a very versatile technique, capable of working in vacuum, air, and liquid, and on a variety of different samples. A metalized AFM tip is necessary in order to take advantage of the plasmonic enhancement. The most commonly used metal is Ag, thanks to its high plasmonic activity in the visible range. Unfortunately, though, the tip metallization process is still challenging and not fully reliable, yielding inconsistent enhancement factors even within the same batch of tips; as a consequence, many tips are usually prepared at once (for a single experiment), to ensure that at least one of them is sufficiently active. As the lifetime of an unprotected, Ag-coated plasmonic probe is only a few hours, the procedure is inefficient and results in a substantial waste of materials and money. In this work, we establish a cleaning routine to effectively re-use Ag-coated AFM–TERS probes, drastically reducing costs without compromising the quality of the experimental results.

Compact metal probes: A solution for atomic force microscopy based tip-enhanced Raman spectroscopy

2012 ◽  
Vol 83 (12) ◽  
pp. 123708 ◽  
Author(s):  
R. D. Rodriguez ◽  
E. Sheremet ◽  
S. Müller ◽  
O. D. Gordan ◽  
A. Villabona ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy

scholarly journals Exploring Intramolecular Methyl–Methyl Coupling on a Metal Surface for Edge-Extended Graphene Nanoribbons

2021 ◽  
Vol 03 (02) ◽  
pp. 128-133
Author(s):  
Zijie Qiu ◽  
Qiang Sun ◽  
Shiyong Wang ◽  
Gabriela Borin Barin ◽  
Bastian Dumslaff ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
High Resolution ◽  
Graphene Nanoribbons ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Methyl Methyl ◽  
Atomic Force ◽  
Edge Extension

Intramolecular methyl–methyl coupling on Au (111) is explored as a new on-surface protocol for edge extension in graphene nanoribbons (GNRs). Characterized by high-resolution scanning tunneling microscopy, noncontact atomic force microscopy, and Raman spectroscopy, the methyl–methyl coupling is proven to indeed proceed at the armchair edges of the GNRs, forming six-membered rings with sp3- or sp2-hybridized carbons.

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