scholarly journals Sensitivity analysis of the electrostatic interaction between the atomic force microscopy probe and a thin dielectric film with 3D-localized charge cloud

2019 ◽  
Vol 125 (4) ◽  
pp. 045305 ◽  
Author(s):  
M. Azib ◽  
F. Baudoin ◽  
N. Binaud ◽  
C. Villeneuve-Faure ◽  
G. Teyssedre ◽  
...  
Keyword(s):  
Sensitivity Analysis ◽  
Atomic Force Microscopy ◽  
Electrostatic Interaction ◽  
Dielectric Film ◽  
Atomic Force Microscopy Probe ◽  
Force Microscopy ◽  
Thin Dielectric Film ◽  
Atomic Force ◽  
Charge Cloud

Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe

2006 ◽  
Vol 100 (7) ◽  
pp. 074315 ◽  
Author(s):  
Osamu Takeuchi ◽  
Takaaki Miyakoshi ◽  
Atsushi Taninaka ◽  
Katsunori Tanaka ◽  
Daichi Cho ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Control ◽  
Force Spectroscopy ◽  
Dynamic Force ◽  
Atomic Force Microscopy Probe ◽  
Dynamic Force Spectroscopy ◽  
Force Microscopy ◽  
Spectroscopy Measurement ◽  
Atomic Force
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