Physical nature of electrically detected magnetic resonance through spin dependent trap assisted tunneling in insulators

2018 ◽  
Vol 124 (21) ◽  
pp. 215105 ◽  
Author(s):  
M. A. Anders ◽  
P. M. Lenahan ◽  
C. J. Cochrane ◽  
Johan van Tol
Keyword(s):  
Magnetic Resonance ◽  
Physical Nature ◽  
Electrically Detected Magnetic Resonance ◽  
Trap Assisted Tunneling ◽  
Assisted Tunneling

C-Face Interface Defects in 4H-SiC MOSFETs Studied by Electrically Detected Magnetic Resonance

2014 ◽  
Vol 778-780 ◽  
pp. 414-417 ◽  
Author(s):  
Takahide Umeda ◽  
Mitsuo Okamoto ◽  
Ryo Arai ◽  
Yoshihiro Satoh ◽  
Ryouji Kosugi ◽  
...  
Keyword(s):  
Magnetic Resonance ◽  
Interface Defects ◽  
Electrically Detected Magnetic Resonance

This paper reports an EDMR (electrically detected magnetic resonance) observation on 4H-SiC(000-1) “C face” MOSFETs. We found a new strong EDMR signal in wet-oxidized C-face 4H-SiC MOSFETs, which originates from intrinsic interface defects on C-face SiC-SiO2 structures.

APPLICATION OF EPITAXIAL UNIPOLAR BARRIERS TO REDUCE NOISE CURRENTS IN PHOTODETECTORS

2011 ◽  
Vol 20 (03) ◽  
pp. 557-564
Author(s):  
G. R. SAVICH ◽  
J. R. PEDRAZZANI ◽  
S. MAIMON ◽  
G. W. WICKS
Keyword(s):  
Leakage Current ◽  
Surface Passivation ◽  
Leakage Currents ◽  
Type Region ◽  
Surface Leakage Current ◽  
Unipolar Barrier ◽  
Trap Assisted Tunneling ◽  
Assisted Tunneling ◽  
Tunneling Currents ◽  
Surface Leakage

Tunneling currents and surface leakage currents are both contributors to the overall dark current which limits many semiconductor devices. Surface leakage current is generally controlled by applying a post-epitaxial passivation layer; however, surface passivation is often expensive and ineffective. Band-to-band and trap assisted tunneling currents cannot be controlled through surface passivants, thus an alternative means of control is necessary. Unipolar barriers, when appropriately applied to standard electronic device structures, can reduce the effects of both surface leakage and tunneling currents more easily and cost effectively than other methods, including surface passivation. Unipolar barriers are applied to the p -type region of a conventional, MBE grown, InAs based pn junction structures resulting in a reduction of surface leakage current. Placing the unipolar barrier in the n -type region of the device, has the added benefit of reducing trap assisted tunneling current as well as surface leakage currents. Conventional, InAs pn junctions are shown to exhibit surface leakage current while unipolar barrier photodiodes show no detectable surface currents.

Recombination centers inGaAs/Al0.4Ga0.6Asheterostructures investigated by optically and electrically detected magnetic resonance

1998 ◽  
Vol 58 (8) ◽  
pp. 4892-4902 ◽  
Author(s):  
T. Wimbauer ◽  
M. S. Brandt ◽  
M. W. Bayerl ◽  
N. M. Reinacher ◽  
M. Stutzmann ◽  
...  
Keyword(s):  
Magnetic Resonance ◽  
Electrically Detected Magnetic Resonance ◽  
Recombination Centers

Trap-Assisted Tunneling in MIS and Schottky Structures

1983 ◽  
Vol 79 (1) ◽  
pp. 223-236 ◽  
Author(s):  
F. Campabadal ◽  
V. Milian ◽  
X. Aymerich-Humet
Keyword(s):  
Trap Assisted Tunneling ◽  
Assisted Tunneling

scholarly journals Electrically Detected Magnetic Resonance of Donors and Interfacial Defects in Silicon Nanowires

2011 ◽  
Vol 3 (4) ◽  
pp. 568-574 ◽  
Author(s):  
M. Fanciulli ◽  
A. Vellei ◽  
C. Canevali ◽  
S. Baldovino ◽  
G. Pennelli ◽  
...  
Keyword(s):  
Magnetic Resonance ◽  
Silicon Nanowires ◽  
Interfacial Defects ◽  
Electrically Detected Magnetic Resonance

scholarly journals Trap-assisted tunneling in AlGaN avalanche photodiodes

AIP Advances ◽  
2017 ◽  
Vol 7 (6) ◽  
pp. 065016 ◽  
Author(s):  
Z. G. Shao ◽  
Q. J. Gu ◽  
X. F. Yang ◽  
J. Zhang ◽  
Y. W. Kuang ◽  
...  
Keyword(s):  
Avalanche Photodiodes ◽  
Trap Assisted Tunneling ◽  
Assisted Tunneling

ChemInform Abstract: Electrically Detected Magnetic Resonance in Dielectric Semiconductor Systems of Current Interest

ChemInform ◽  
2012 ◽  
Vol 43 (11) ◽  
pp. no-no
Author(s):  
P. M. Lenahan ◽  
C. J. Cochrane ◽  
J. P. Campbell ◽  
J. T. Ryan
Keyword(s):  
Magnetic Resonance ◽  
Current Interest ◽  
Electrically Detected Magnetic Resonance

Electrically detected magnetic resonance applied to polyaniline

1999 ◽  
Vol 101 (1-3) ◽  
pp. 805-806 ◽  
Author(s):  
C.F.O, Graeff ◽  
C.A. Brunello ◽  
R.M. Faria
Keyword(s):  
Magnetic Resonance ◽  
Electrically Detected Magnetic Resonance
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