A scalable arbitrary waveform generator for atomic physics experiments based on field-programmable gate array technology

2019 ◽  
Vol 90 (4) ◽  
pp. 043101 ◽  
Author(s):  
Sean Donnellan ◽  
Ian R. Hill ◽  
William Bowden ◽  
Richard Hobson
Keyword(s):  
Atomic Physics ◽  
Field Programmable Gate Array ◽  
Waveform Generator ◽  
Arbitrary Waveform Generator ◽  
Array Technology ◽  
Field Programmable ◽  
Gate Array ◽  
Arbitrary Waveform ◽  
Physics Experiments

Image processing virtual circuitry for physics based applications on field programmable gate array technology

2008 ◽  
Author(s):  
Andrew J. Tickle ◽  
Jon Marchant ◽  
Iain A. Steele ◽  
Gregory Clarke ◽  
Jeremy S. Smith ◽  
...  
Keyword(s):  
Image Processing ◽  
Field Programmable Gate Array ◽  
Array Technology ◽  
Field Programmable ◽  
Gate Array

Field Programmable Gate Array Technology for NPP I&Cs

2014 ◽  
pp. 116-145
Author(s):  
Vladimir Sklyar ◽  
Anton Andrashov ◽  
Eugene Babeshko ◽  
Andriy Kovalenko
Keyword(s):  
Field Programmable Gate Array ◽  
Practical Experience ◽  
General Information ◽  
Assessment Methodology ◽  
Array Technology ◽  
Field Programmable ◽  
Gate Array ◽  
Solution Techniques

FPGA is a convenient technology that is being applied intensively to build I&CS for critical industries like NPPs. Practical experience confirms that in some cases application of the FPGA technology is much more reasonable than application of other technologies like microprocessors, etc. Experience of RPC Radiy in FPGA-based I&C development is provided in this chapter, as well as general information on FPGAs. Dependability of NPP I&CS is an important but challenging task. There are several techniques that can be applied for safety and dependability assessments, but all of them have limitations and cannot be easily applied in most cases. Sometimes combined usage of different methods is the most appropriate solution. Techniques of dependability assessment and achievement developed and used by RPC Radiy, as well as elements of the assessment methodology are briefly described.

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