scholarly journals Sensitivity analysis of pars-tensa young’s modulus estimation using inverse finite-element modeling

2018 ◽  
Author(s):  
S. Alireza Rohani ◽  
Mai Elfarnawany ◽  
Sumit K. Agrawal ◽  
Hanif M. Ladak
Keyword(s):  
Sensitivity Analysis ◽  
Finite Element ◽  
Finite Element Modeling ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Element Modeling ◽  
Pars Tensa

scholarly journals Evaluating Mechanical Properties of Thin Layers using Nanoindentation and Finite-Element Modeling: Implanted Metals and Deposited Layers

1996 ◽  
Vol 438 ◽  
Author(s):  
J. A. Knapp ◽  
D. M. Follstaedt ◽  
J. C. Barbour ◽  
S. M. Myers ◽  
J. W. Ager ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Finite Element ◽  
Finite Element Modeling ◽  
Yield Stress ◽  
Young’S Modulus ◽  
Layer Thickness ◽  
Young's Modulus ◽  
Thin Layers ◽  
Element Modeling ◽  
Surface Modified

AbstractWe present a methodology based on finite-element modeling of nanoindentation data to extract reliable and accurate mechanical properties from thin, hard films and surface-modified layers on softer substrates. The method deduces the yield stress, Young's modulus, and hardness from indentations as deep as 50% of the layer thickness.

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