scholarly journals Recombination defects at the 4H-SiC/SiO2 interface investigated with electrically detected magnetic resonance and ab initio calculations

2018 ◽  
Vol 124 (4) ◽  
pp. 045302 ◽  
Author(s):  
J. Cottom ◽  
G. Gruber ◽  
G. Pobegen ◽  
T. Aichinger ◽  
A. L. Shluger
2016 ◽  
Vol 119 (18) ◽  
pp. 181507 ◽  
Author(s):  
J. Cottom ◽  
G. Gruber ◽  
P. Hadley ◽  
M. Koch ◽  
G. Pobegen ◽  
...  

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Vol 125 (40) ◽  
pp. 12268-12276 ◽  
Author(s):  
Koeppe ◽  
Haiyan Sun ◽  
Patrick C. A. van der Wel ◽  
Erin M. Scherer ◽  
Peter Pulay ◽  
...  

1997 ◽  
Vol 90 (3) ◽  
pp. 495-497
Author(s):  
CLAUDIO ESPOSTI ◽  
FILIPPO TAMASSIA ◽  
CRISTINA PUZZARINI ◽  
RICCARDO TARRONI ◽  
ZDENEK ZELINGER

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