scholarly journals Automated translating beam profiler for in situ laser beam spot-size and focal position measurements

2018 ◽  
Vol 89 (3) ◽  
pp. 035114 ◽  
Author(s):  
James Keaveney
2014 ◽  
Vol 42 (10) ◽  
pp. 2694-2695 ◽  
Author(s):  
Petru-Edward Nica ◽  
George B. Rusu ◽  
Oana-Georgiana Dragos ◽  
Cristian Ursu

1981 ◽  
Vol 20 (11) ◽  
pp. 1933 ◽  
Author(s):  
James T. Luxon ◽  
David E. Parker

1995 ◽  
Vol 34 (36) ◽  
pp. 8247 ◽  
Author(s):  
Miguel A. Porras ◽  
Rafael Medina

1985 ◽  
Vol 57 (8) ◽  
pp. 1698-1703 ◽  
Author(s):  
K. L. Jansen ◽  
Joel M. Harris

2001 ◽  
Vol 15 (24n25) ◽  
pp. 3359-3360 ◽  
Author(s):  
Hye-Won Seo ◽  
Quark Y. Chen ◽  
Chong Wang ◽  
Wei-Kan Chu ◽  
T. M. Chuang ◽  
...  

We have fabricated nano-scaled planar superconductor-insulator-superconductor Josephson junctions using focused ion beam (FIB) with beam spot size ~5 nm . To study the effectiveness of this fabrication technique and for the purpose of comparisons, a variety of samples have been made based on high temperature superconducting (HTS) YBa2Cu3O7-δ electrodes. The insulators are either vacuum or silicon dioxide. The samples showed current-voltage (IV) characteristics typical of a resistively shunted junction (RSJ). We will discuss various aspects of the processing methods and the physical significance of the junction characteristics.


2014 ◽  
Vol 24 (03n04) ◽  
pp. 101-110 ◽  
Author(s):  
S. Matsuyama ◽  
K. Ishii ◽  
S. Suzuki ◽  
A. Terakawa ◽  
M. Fujiwara ◽  
...  

We report on the development of a high-current microbeam system for wavelength-dispersive X-ray micro particle-induced X-ray emission (WDX-[Formula: see text]-PIXE) for chemical state mapping. The microbeam system is composed of two slits and a quadrupole doublet lens mounted on a heavy rigid support. The microbeam system is installed immediately after a switching magnet. A beam brightness of [Formula: see text] is obtained at a half-divergence of 0.1 mrad. A beam current of more than 300 pA is obtained for object sizes of [Formula: see text] with a half-divergence of 0.2 mrad, which corresponds to a beam spot size of [Formula: see text]. The calculated spot size of the beam was [Formula: see text] and the measured spot size was [Formula: see text]. The WDX-[Formula: see text]-PIXE system with the microbeam system is now operational.


2013 ◽  
Vol 84 (7) ◽  
pp. 073102 ◽  
Author(s):  
S. P. Ram ◽  
S. K. Tiwari ◽  
S. R. Mishra ◽  
H. S. Rawat

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