scholarly journals Growth of boron-doped few-layer graphene by molecular beam epitaxy

2018 ◽  
Vol 112 (16) ◽  
pp. 163103 ◽  
Author(s):  
G. V. Soares ◽  
S. Nakhaie ◽  
M. Heilmann ◽  
H. Riechert ◽  
J. M. J. Lopes
RSC Advances ◽  
2020 ◽  
Vol 10 (59) ◽  
pp. 35957-35957
Author(s):  
Shubhda Srivastava ◽  
Shubhendra K. Jain ◽  
Govind Gupta ◽  
T. D. Senguttuvan ◽  
Bipin Kumar Gupta

Correction for ‘Boron-doped few-layer graphene nanosheet gas sensor for enhanced ammonia sensing at room temperature’ by Shubhda Srivastava et al., RSC Adv., 2020, 10, 1007–1014. DOI: 10.1039/C9RA08707A


2014 ◽  
Vol 104 (25) ◽  
pp. 252104 ◽  
Author(s):  
M. Ajmal Khan ◽  
K. Nakamura ◽  
W. Du ◽  
K. Toko ◽  
N. Usami ◽  
...  

2013 ◽  
Vol 378 ◽  
pp. 201-204 ◽  
Author(s):  
M. Ajmal Khan ◽  
Kosuke O. Hara ◽  
Kotaro Nakamura ◽  
Weijie Du ◽  
Masakazu Baba ◽  
...  

2014 ◽  
Vol 43 (4) ◽  
pp. 931-937 ◽  
Author(s):  
Nupur Bhargava ◽  
Jay Prakash Gupta ◽  
Thomas Adam ◽  
James Kolodzey

2014 ◽  
Vol 189 ◽  
pp. 15-20 ◽  
Author(s):  
Sheng Wang ◽  
Lara Fernandes dos Santos ◽  
Ulrich Wurstbauer ◽  
Lei Wang ◽  
Loren N. Pfeiffer ◽  
...  

1999 ◽  
Vol 581 ◽  
Author(s):  
F. Edelman ◽  
F. Börner ◽  
R. Krause-Rehrberg ◽  
P. Werner ◽  
R. Weil ◽  
...  

ABSTRACTThe crystallization behavior (ordering) of undoped and boron-doped Si0.5Ge0.5 films, deposited on SiO2/Si(001) substrate by molecular beam epitaxy in hish vacuum at room temperature, were studied by XRD, HRTEM and in situ by Doppler broadening spectroscopy using monoenergetic positrons. Some decomposition features of SiGe solid solutions were demonstrated via splitting the XRD peaks at high temperatures. The SiGe decomposition was detected in the precrystalline state of the SiGe undoped and doped films in the temperature range from 450 to 600 K by compaering S- and W-parameters of SiGe with that of amorphous silicon and germanium. In conclusion, we discuss model of internim ordering states before crystallization.


2017 ◽  
Vol 28 (30) ◽  
pp. 305601 ◽  
Author(s):  
Linjie Zhan ◽  
Wen Wan ◽  
Zhenwei Zhu ◽  
Zhijuan Zhao ◽  
Zhenhan Zhang ◽  
...  

1989 ◽  
Vol 55 (8) ◽  
pp. 795-797 ◽  
Author(s):  
T. L. Lin ◽  
R. W. Fathauer ◽  
P. J. Grunthaner

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