Experimental validation of analytical models for a rapid determination of cycle parameters in thermoplastic injection molding

2017 ◽  
Author(s):  
Baptiste Pignon ◽  
Vincent Sobotka ◽  
Nicolas Boyard ◽  
Didier Delaunay
2004 ◽  
Vol 126 (4) ◽  
pp. 781-789 ◽  
Author(s):  
Andrew W. Osburn ◽  
Matthew A. Franchek

Presented in this paper is a feedforward controller identification process for the transient fueling control of spark ignition (SI) engines. The objective of an SI fueling control system is to guarantee a prespecified air–fuel (A/F) ratio, despite changing driver demands commanded through the throttle. The controller identification process is based on standard system identification tools and is comprised of three steps. The first step involves the design and implementation of a repetitive feedback controller. Next, the engine is subjected to a prespecified periodic throttle motion for which the repetitive controller achieves precise A/F control as t→∞. Finally, using the engine speed, the mass air flow, and the fuel pulsewidth information during precise fueling conditions, the feedforward fueling controller is identified using standard parametric system identification tools. This identification process can be performed during engine warm-up, thereby enabling a rapid determination of the fueling requirements as a function of temperature. Experimental validation is provided on a 1999 Ford 4.6L V-8 fuel injected engine with sequential port injection.


Author(s):  
T. Y. Tan ◽  
W. K. Tice

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.


2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu

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