X-ray diffraction study of polycrystalline BiFeO3 thin films under electric field

2008 ◽  
Vol 93 (4) ◽  
pp. 042907 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Yoshitaka Nakamura ◽  
Takeshi Kanashima ◽  
Hiroshi Funakubo ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Field ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bifeo3 Thin Films

X-ray Diffraction Study of Electric-field-induced Strains in Polycrystalline BiFeO3 Thin Films at Low Temperature Using Synchrotron Radiation

2011 ◽  
Vol 59 (3(1)) ◽  
pp. 2556-2559 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Hironori Fujisawa ◽  
Jung Min Park ◽  
Takeshi Kanashima ◽  
...  
Keyword(s):  
Thin Films ◽  
Synchrotron Radiation ◽  
Low Temperature ◽  
Electric Field ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bifeo3 Thin Films

Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

2017 ◽  
Vol 111 (8) ◽  
pp. 082907 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Hiroshi Funakubo ◽  
Takao Shimizu ◽  
Daichi Ichinose ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Field ◽  
Lattice Distortion ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Bifeo3 Thin Films

Comprehensive X-Ray Diffraction Study of YBa$_{\bf 2}$Cu$_{\bf 3}$O$_{{\bf 7}-\ninmb{\delta}}$ Thin Films

1995 ◽  
Vol 34 (Part 1, No. 11) ◽  
pp. 6036-6040
Author(s):  
A. Z. Moshfegh ◽  
A. H. Fatollahi ◽  
Y. Q. Wang ◽  
Y. Y. Sun ◽  
P. H. Hor ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray

In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin films

2015 ◽  
Vol 3 (43) ◽  
pp. 11357-11365 ◽  
Author(s):  
Geert Rampelberg ◽  
Bob De Schutter ◽  
Wouter Devulder ◽  
Koen Martens ◽  
Iuliana Radu ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
Resistance Switching ◽  
X Ray Diffraction ◽  
X Ray

VO2 and V2O3 thin films were prepared during in situ XRD investigation by oxidation and reduction of V and V2O5. Films show up to 5 orders of magnitude resistance switching.

In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment

2005 ◽  
Vol 244 (1-4) ◽  
pp. 281-284 ◽  
Author(s):  
Naohiko Kato ◽  
Ichiro Konomi ◽  
Yoshiki Seno ◽  
Tomoyoshi Motohiro
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Diffraction Study ◽  
Crystallization Process ◽  
X Ray Diffraction ◽  
X Ray

In-situ x-ray diffraction study of the growth of highly strained epitaxial BaTiO3 thin films

2013 ◽  
Vol 103 (24) ◽  
pp. 242904 ◽  
Author(s):  
J. Sinsheimer ◽  
S. J. Callori ◽  
B. Ziegler ◽  
B. Bein ◽  
P. V. Chinta ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Highly Strained

Positron and X-ray diffraction study of Cu–Se, In–Se and CuInSe2 thin films

2002 ◽  
Vol 54 (2-3) ◽  
pp. 169-174 ◽  
Author(s):  
N Nancheva ◽  
P Docheva ◽  
N Djourelov ◽  
M Balcheva
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray

X‐ray diffraction study of interdiffusion in bimetallic Ag/Cu thin films

1976 ◽  
Vol 47 (7) ◽  
pp. 2857-2861 ◽  
Author(s):  
M. Murakami ◽  
D. deFontaine
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray
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