scholarly journals Electrochemical atomic force microscopy: In situ monitoring of electrochemical processes

2017 ◽  
Author(s):  
Melania Reggente ◽  
Daniele Passeri ◽  
Marco Rossi ◽  
Emanuela Tamburri ◽  
Maria Letizia Terranova
Keyword(s):  
Atomic Force Microscopy ◽  
In Situ Monitoring ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Processes

In situ monitoring of single molecule binding reactions with time-lapse atomic force microscopy on functionalized DNA origami

Nanoscale ◽  
2011 ◽  
Vol 3 (6) ◽  
pp. 2481 ◽  
Author(s):  
Na Wu ◽  
Xingfei Zhou ◽  
Daniel M. Czajkowsky ◽  
Ming Ye ◽  
Dongdong Zeng ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Time Lapse ◽  
Dna Origami ◽  
In Situ Monitoring ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Tuning and in situ monitoring of surface-initiated, atom-transfer radical polymerization of acrylamide derivatives in water-based solvents

2019 ◽  
Vol 10 (29) ◽  
pp. 3933-3942 ◽  
Author(s):  
Joydeb Mandal ◽  
Rok Simic ◽  
Nicholas D. Spencer
Keyword(s):  
Atomic Force Microscopy ◽  
Quartz Crystal ◽  
Polymer Brush ◽  
In Situ Monitoring ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Water Based ◽  
Kinetics Of

SI-ATRP kinetics of acrylamide derivatives is studied in situ using a quartz crystal microbalance with dissipation (QCM-D). The effect of growth kinetics on polymer-brush dispersity have been examined using colloidal-probe atomic force microscopy.

IN SITU CHARACTERISATION OF CALCITE GROWTH AND INHIBITION USING ATOMIC FORCE MICROSCOPY

2002 ◽  
Vol 16 (01n02) ◽  
pp. 25-33 ◽  
Author(s):  
MANIJEH M. REYHANI ◽  
ALLAN OLIVEIRA ◽  
GORDON M. PARKINSON ◽  
FRANCA JONES ◽  
ANDREW L. ROHL ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Real Time ◽  
Crystal Surface ◽  
In Situ Monitoring ◽  
Organic Additives ◽  
Additive Structure ◽  
Force Microscopy ◽  
Step Motion ◽  
Atomic Force

Real time in situ monitoring of calcite growth and inhibition on the cleavage plane [Formula: see text] is investigated using atomic force microscopy (AFM). Calcite growth and inhibition were studied using a Molecular Imaging microscope in contact mode, equipped with an in situ fluid cell. As has been reported previously, it is observed that calcite growth from aqueous solution is by motion of mono-molecular steps, and dissolution by a combination of step motion and etch pit expansion. The measured step heights were between 2.7 to 3 Å. Our aim is to study the effects of a range of phosphonate-based crystal growth inhibitors of related structure, in order to provide insight into the mechanism of inhibition as a function of the additive structure. Results of this study demonstrate the effect of inhibitors on the growth steps and terraces on the [Formula: see text] surface of calcite in real time. The organic additives bind to the crystal surface, with selective binding to the step edges particularly evident in some cases. In other cases, it appears that the additive acts by binding to the terraces on the crystal surface, resulting in inhibition by coating the surface. Efforts to correlate the observations made by atomic force microscopy with bulk crystallization experiments have been made.

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force

Use of in-situ atomic force microscopy to monitor the biodegradation of polyhydroxyalkanoates (PHAs)

2001 ◽  
Vol 167 (1) ◽  
pp. 139-151 ◽  
Author(s):  
Connie J. Rossini ◽  
Justinn F. Arceo ◽  
Evan R. McCarney ◽  
Brian H. Augustine ◽  
Douglas E. Dennis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force
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