scholarly journals Vortex spin-torque oscillator stabilized by phase locked loop using integrated circuits

AIP Advances ◽  
2017 ◽  
Vol 7 (5) ◽  
pp. 056653 ◽  
Author(s):  
Martin Kreissig ◽  
R. Lebrun ◽  
F. Protze ◽  
K. J. Merazzo ◽  
J. Hem ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Phase Locked Loop ◽  
Spin Torque

Analysis of phase noise in a spin torque oscillator stabilized by phase locked loop

2016 ◽  
Vol 9 (5) ◽  
pp. 053005 ◽  
Author(s):  
Shingo Tamaru ◽  
Hitoshi Kubota ◽  
Kay Yakushiji ◽  
Akio Fukushima ◽  
Shinji Yuasa
Keyword(s):  
Phase Noise ◽  
Phase Locked Loop ◽  
Spin Torque

scholarly journals Extremely Coherent Microwave Emission from Spin Torque Oscillator Stabilized by Phase Locked Loop

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Shingo Tamaru ◽  
Hitoshi Kubota ◽  
Kay Yakushiji ◽  
Shinji Yuasa ◽  
Akio Fukushima
Keyword(s):  
Phase Locked Loop ◽  
Microwave Emission ◽  
Spin Torque

Physical Origin and Theoretical Limit of the Phase Stability of a Spin-Torque Oscillator Stabilized by a Phase-Locked Loop

2017 ◽  
Vol 7 (6) ◽  
Author(s):  
Shingo Tamaru ◽  
Hitoshi Kubota ◽  
Kay Yakushiji ◽  
Akio Fukushima ◽  
Shinji Yuasa
Keyword(s):  
Phase Stability ◽  
Phase Locked Loop ◽  
Spin Torque ◽  
Physical Origin ◽  
Theoretical Limit

Generation of Highly Stable Microwave from a Spin Torque Oscillator by Phase Locked Loop

2015 ◽  
Author(s):  
S. Tamaru ◽  
H. Kubota ◽  
K. Yakushiji ◽  
S. Yuasa ◽  
A. Fukushima
Keyword(s):  
Phase Locked Loop ◽  
Spin Torque

Noise reduction of spin torque oscillator by phase-locked loop with combinational frequency tuning method

2020 ◽  
Vol 117 (7) ◽  
pp. 072407
Author(s):  
Lang Zeng ◽  
Xichuan Ma ◽  
Hao-Hsuan Chen ◽  
Yan Zhou ◽  
Deming Zhang ◽  
...  
Keyword(s):  
Noise Reduction ◽  
Frequency Tuning ◽  
Phase Locked Loop ◽  
Spin Torque ◽  
Tuning Method

Stabilization of phase noise in vortex spin torque nano-oscillators by a Phase Locked Loop

2017 ◽  
Author(s):  
M. Kreissig ◽  
S. Wittrock ◽  
R. Lebrun ◽  
S. Menshawy ◽  
F. Protze ◽  
...  
Keyword(s):  
Phase Noise ◽  
Phase Locked Loop ◽  
Spin Torque

Influence of output power of a spin torque oscillator on phase locked loop operation

2016 ◽  
Vol 55 (9) ◽  
pp. 093003 ◽  
Author(s):  
Shingo Tamaru ◽  
Hitoshi Kubota ◽  
Kay Yakushiji ◽  
Akio Fukushima ◽  
Shinji Yuasa
Keyword(s):  
Output Power ◽  
Phase Locked Loop ◽  
Spin Torque

Theory of spin torque nano-oscillator-based phase-locked loop

2017 ◽  
Vol 122 (12) ◽  
pp. 123903 ◽  
Author(s):  
Alexander A. Mitrofanov ◽  
Ansar R. Safin ◽  
Nikolay N. Udalov ◽  
Mikhail V. Kapranov
Keyword(s):  
Phase Locked Loop ◽  
Spin Torque

Some applications of electron beam microanalysis techniques in VLSI process evaluation

1983 ◽  
Vol 41 ◽  
pp. 160-161
Author(s):  
Simon Thomas
Keyword(s):  
Integrated Circuits ◽  
Process Evaluation ◽  
Large Scale ◽  
Technology Development ◽  
Analytical Techniques ◽  
Successful Implementation ◽  
Analysis Of Failures ◽  
Characterization Of Materials ◽  
Circuits Vlsi

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.

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