Scanning near-field microscopy of carrier lifetimes in m-plane InGaN quantum wells
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2003 ◽
Vol 0
(7)
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pp. 2674-2677
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2006 ◽
Vol 3
(6)
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pp. 1897-1901
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2017 ◽
Vol 255
(5)
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pp. 1700322
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