scholarly journals Crystal structure analysis in solution-processed uniaxially oriented polycrystalline thin film of non-peripheral octahexyl phthalocyanine by grazing incidence wide-angle x-ray scattering techniques

2016 ◽  
Vol 109 (15) ◽  
pp. 153302 ◽  
Author(s):  
Masashi Ohmori ◽  
Takashi Uno ◽  
Mitsuhiro Nakatani ◽  
Chika Nakano ◽  
Akihiko Fujii ◽  
...  
Keyword(s):  
Thin Film ◽  
Crystal Structure ◽  
Structure Analysis ◽  
Grazing Incidence ◽  
Crystal Structure Analysis ◽  
Wide Angle ◽  
Polycrystalline Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Oriented Polycrystalline

scholarly journals The Diffraction Pattern Calculator(DPC) toolkit: a user-friendly approach to unit-cell lattice parameter identification of two-dimensional grazing-incidence wide-angle X-ray scattering data

2014 ◽  
Vol 47 (6) ◽  
pp. 2090-2099 ◽  
Author(s):  
Anna K. Hailey ◽  
Anna M. Hiszpanski ◽  
Detlef-M. Smilgies ◽  
Yueh-Lin Loo
Keyword(s):  
Crystal Structure ◽  
Grazing Incidence ◽  
Unit Cell ◽  
Lattice Parameters ◽  
Scattering Data ◽  
Wide Angle ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

TheDPCtoolkit is a simple-to-use computational tool that helps users identify the unit-cell lattice parameters of a crystal structure that are consistent with a set of two-dimensional grazing-incidence wide-angle X-ray scattering data. The input data requirements are minimal and easy to assemble from data sets collected with any position-sensitive detector, and the user is required to make as few initial assumptions about the crystal structure as possible. By selecting manual or automatic modes of operation, the user can either visually match the positions of the experimental and calculated reflections by individually tuning the unit-cell parameters or have the program perform this process for them. Examples that demonstrate the utility of this program include determining the lattice parameters of a polymorph of a fluorinated contorted hexabenzocoronene in a blind test and refining the lattice parameters of the thin-film phase of 5,11-bis(triethylsilylethynyl)anthradithiophene with the unit-cell dimensions of its bulk crystal structure being the initial inputs.

Crystal Structure Analysis of Poly(l-lactic Acid) α Form On the basis of the 2-Dimensional Wide-Angle Synchrotron X-ray and Neutron Diffraction Measurements

2011 ◽  
Vol 44 (16) ◽  
pp. 6441-6452 ◽  
Author(s):  
Kaewkan Wasanasuk ◽  
Kohji Tashiro ◽  
Makoto Hanesaka ◽  
Tokashi Ohhara ◽  
Kazuo Kurihara ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Lactic Acid ◽  
Neutron Diffraction ◽  
Structure Analysis ◽  
Crystal Structure Analysis ◽  
Wide Angle ◽  
X Ray

scholarly journals Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

2020 ◽  
Vol 56 (30) ◽  
pp. 4204-4207 ◽  
Author(s):  
Andrew M. Levine ◽  
Guanhong Bu ◽  
Sankarsan Biswas ◽  
Esther H. R. Tsai ◽  
Adam B. Braunschweig ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Electron Diffraction ◽  
Organic Semiconductor ◽  
Grazing Incidence ◽  
Wide Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Semiconductor Thin Films ◽  
Insight Into

The complementary methods of MicroED and GIWAXS provide insight into crystal structure arrangement in organic semiconductor thin films.

Quantifying Multiple Crystallite Orientations and Crystal Heterogeneities in Complex Thin Film Materials

2019 ◽  
Author(s):  
Jonathan Ogle ◽  
Daniel Powell ◽  
Eric Amerling ◽  
Detlef Matthias Smilgies ◽  
Luisa Whittaker-Brooks
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Structural Design ◽  
Grazing Incidence ◽  
Crystallite Orientation ◽  
Miller Index ◽  
X Ray ◽  
X Ray Scattering ◽  
Orientation Distributions ◽  
Orientation Information

<p>Thin film materials have become increasingly complex in morphological and structural design. When characterizing the structure of these films, a crucial field of study is the role that crystallite orientation plays in giving rise to unique electronic properties. It is therefore important to have a comparative tool for understanding differences in crystallite orientation within a thin film, and also the ability to compare the structural orientation between different thin films. Herein, we designed a new method dubbed the mosaicity factor (MF) to quantify crystallite orientation in thin films using grazing incidence wide-angle X-ray scattering (GIWAXS) patterns. This method for quantifying the orientation of thin films overcomes many limitations inherent in previous approaches such as noise sensitivity, the ability to compare orientation distributions along different axes, and the ability to quantify multiple crystallite orientations observed within the same Miller index. Following the presentation of MF, we proceed to discussing case studies to show the efficacy and range of application available for the use of MF. These studies show how using the MF approach yields quantitative orientation information for various materials assembled on a substrate.<b></b></p>

scholarly journals Preparative-scale HPLC Resolution of Metallacyclic η3-Allyltricarbonyliron Complexes and Determination of the Absolute Configuration by X-Ray Crystal Structure Analysis

1999 ◽  
Vol 23 (9) ◽  
pp. 578-579
Author(s):  
Rainer Schobert ◽  
Hermann Pfab ◽  
Jutta Böhmer ◽  
Frank Hampel ◽  
Andreas Werner
Keyword(s):  
Crystal Structure ◽  
Silica Gel ◽  
Structure Analysis ◽  
Absolute Configuration ◽  
Crystal Structure Analysis ◽  
Preparative Scale ◽  
X Ray ◽  
The Absolute

Racemates of (η3-allyl)tricarbonyliron lactone complex Fe(CO)3{η1:η3-C(O)XCH2CHCMeCH2} 1a (X = O) and (η3-allyl)tricarbonyliron lactam complex 2a (X = NMe) are resolved on a preparative scale by HPLC on cellulose tris(3,5-dimethylphenyl)carbamate/silica gel RP-8 and the absolute configuration of (-)-2a is determined by X-ray crystal structure analysis.

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