Explanation of diffuse scattering mechanism based on the structure of polar nanoregions in Ba(Ti1−xSnx)O3

2016 ◽  
Vol 120 (12) ◽  
pp. 124103 ◽  
Author(s):  
Tao Shi ◽  
Lin Gu ◽  
Jing Zhu
Keyword(s):  
Diffuse Scattering ◽  
Scattering Mechanism ◽  
Polar Nanoregions

scholarly journals Diffuse scattering from the lead-based relaxor ferroelectric PbMg1/3Ta2/3O3

2011 ◽  
Vol 44 (3) ◽  
pp. 603-609 ◽  
Author(s):  
Antonio Cervellino ◽  
S. N. Gvasaliya ◽  
O. Zaharko ◽  
B. Roessli ◽  
G. M. Rotaru ◽  
...  
Keyword(s):  
Single Crystal ◽  
Atomic Structure ◽  
Diffuse Scattering ◽  
Relaxor Ferroelectric ◽  
The Other ◽  
X Ray Diffraction ◽  
Correlation Lengths ◽  
X Ray ◽  
Displacement Vectors ◽  
Polar Nanoregions

The relaxor ferroelectric PbMg1/3Ta2/3O3was studied by single-crystal neutron and synchrotron X-ray diffraction, and its detailed atomic structure modelled in terms of static Pb displacements that lead to the formation of polar nanoregions. Similar to the other members of the Pb-based relaxor family like PbMg1/3Nb2/3O3or PbZn1/3Nb2/3O3the diffuse scattering in the [H00]/[0K0] scattering plane has a butterfly shape around theh00 Bragg reflections and is orthogonal to the scattering vector forhh0 peaks. In the [HH0]/[00L] plane the diffuse scattering is elongated along the 〈112〉 directions and is orthogonal to the scattering vector forhhhreflections. It is found that a model consisting of correlated Pb displacements along the 〈111〉 directions reproduces adequately the main features of the diffuse scattering in PbMg1/3Ta2/3O3when the correlation lengths between the Pb-ion displacement vectors are longest along the 〈111〉 and shortest along the 〈11{\overline 2}〉 and 〈1{\overline 1}0〉 directions.

scholarly journals Neutron diffuse scattering from polar nanoregions in the relaxorPb(Mg1/3Nb2/3)O3

2002 ◽  
Vol 65 (10) ◽  
Author(s):  
K. Hirota ◽  
Z.-G. Ye ◽  
S. Wakimoto ◽  
P. M. Gehring ◽  
G. Shirane
Keyword(s):  
Diffuse Scattering ◽  
Polar Nanoregions

scholarly journals Polar nanoregions and diffuse scattering in the relaxor ferroelectric PbMg1/3Nb2/3O3

2012 ◽  
Vol 85 (22) ◽  
Author(s):  
M. Paściak ◽  
T. R. Welberry ◽  
J. Kulda ◽  
M. Kempa ◽  
J. Hlinka
Keyword(s):  
Diffuse Scattering ◽  
Relaxor Ferroelectric ◽  
Polar Nanoregions

scholarly journals The Influence of Surface on Scattering of Carriers and Kinetic Effects in n-PbTe Films

2016 ◽  
Vol 17 (4) ◽  
pp. 520-526
Author(s):  
M.A. Ruvinskii ◽  
O.B. Kostyuk ◽  
B.S. Dzundza ◽  
V.I. Makovyshyn
Keyword(s):  
Thermoelectric Properties ◽  
Diffuse Scattering ◽  
Scattering Coefficient ◽  
Scattering Mechanism ◽  
Surface Reflection ◽  
Kinetic Effects

Based on the Fuchs-Sondheimer and Mayer models the influence of mechanisms of surface reflection of electrons on the experimental transport and thermoelectric properties of n-PbTe films on various substrates are substrates are considered. The thickness dependences of the Seebeck films based on PbTe are investigated. It is shown that for films on sital substrates mechanism of completely diffuse scattering of carriers (p≈0) are implemented and for the films obtained on fresh chips of mica chips – mixed specular-diffuse scattering mechanism of carriers (scattering coefficient p≈0,4).

Calculation of structure images of crystalline defects

1978 ◽  
Vol 36 (1) ◽  
pp. 282-283
Author(s):  
M.A. O'Keefe ◽  
Sumio Iijima
Keyword(s):  
Diffuse Scattering ◽  
Computing Time ◽  
Continuous Distribution ◽  
Sampling Interval ◽  
Reciprocal Space ◽  
Objective Lens ◽  
Lattice Images ◽  
Slice Method ◽  
Space Cell ◽  
Beam Lattice

We have extended the multi-slice method of computating many-beam lattice images of perfect crystals to calculations for imperfect crystals using the artificial superlattice approach. Electron waves scattered from faulted regions of crystals are distributed continuously in reciprocal space, and all these waves interact dynamically with each other to give diffuse scattering patterns.In the computation, this continuous distribution can be sampled only at a finite number of regularly spaced points in reciprocal space, and thus finer sampling gives an improved approximation. The larger cell also allows us to defocus the objective lens further before adjacent defect images overlap, producing spurious computational Fourier images. However, smaller cells allow us to sample the direct space cell more finely; since the two-dimensional arrays in our program are limited to 128X128 and the sampling interval shoud be less than 1/2Å (and preferably only 1/4Å), superlattice sizes are limited to 40 to 60Å. Apart from finding a compromis superlattice cell size, computing time must be conserved.

Recent applications of TEM to the study of interfaces

1990 ◽  
Vol 48 (4) ◽  
pp. 308-309
Author(s):  
C. Barry Carter
Keyword(s):  
High Resolution ◽  
Sample Preparation ◽  
Grain Boundaries ◽  
Diffuse Scattering ◽  
Imaging Techniques ◽  
Amorphous Material ◽  
Contrast Imaging ◽  
Current State ◽  
Actual Nature ◽  
High Resolution Images

This paper will review the current state of understanding of interface structure and highlight some of the future needs and problems which must be overcome. The study of this subject can be separated into three different topics: 1) the fundamental electron microscopy aspects, 2) material-specific features of the study and 3) the characteristics of the particular interfaces. The two topics which are relevant to most studies are the choice of imaging techniques and sample preparation. The techniques used to study interfaces in the TEM include high-resolution imaging, conventional diffraction-contrast imaging, and phase-contrast imaging (Fresnel fringe images, diffuse scattering). The material studied affects not only the characteristics of the interfaces (through changes in bonding, etc.) but also the method used for sample preparation which may in turn have a significant affect on the resulting image. Finally, the actual nature and geometry of the interface must be considered. For example, it has become increasingly clear that the plane of the interface is particularly important whenever at least one of the adjoining grains is crystalline.A particularly productive approach to the study of interfaces is to combine different imaging techniques as illustrated in the study of grain boundaries in alumina. In this case, the conventional imaging approach showed that most grain boundaries in ion-thinned samples are grooved at the grain boundary although the extent of this grooving clearly depends on the crystallography of the surface. The use of diffuse scattering (from amorphous regions) gives invaluable information here since it can be used to confirm directly that surface grooving does occur and that the grooves can fill with amorphous material during sample preparation (see Fig. 1). Extensive use of image simulation has shown that, although information concerning the interface can be obtained from Fresnel-fringe images, the introduction of artifacts through sample preparation cannot be lightly ignored. The Fresnel-fringe simulation has been carried out using a commercial multislice program (TEMPAS) which was intended for simulation of high-resolution images.

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