scholarly journals Imaging crystal spectrometer for high-resolution x-ray measurements on electron beam ion traps and tokamaks

2016 ◽  
Vol 87 (11) ◽  
pp. 11E339 ◽  
Author(s):  
P. Beiersdorfer ◽  
E. W. Magee ◽  
N. Hell ◽  
G. V. Brown
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Ion Traps ◽  
Crystal Spectrometer ◽  
X Ray

General purpose high‐resolution x‐ray crystal spectrometer (abstract)

1992 ◽  
Vol 63 (10) ◽  
pp. 5022-5022
Author(s):  
R. Barnsley ◽  
A. Abbey ◽  
J. Dunn ◽  
S. Lea ◽  
N. J. Peacock
Keyword(s):  
High Resolution ◽  
General Purpose ◽  
Crystal Spectrometer ◽  
X Ray

New high‐resolution charge transfer x‐ray and electron beam negative resist

1980 ◽  
Vol 37 (3) ◽  
pp. 314-316 ◽  
Author(s):  
Donald C. Hofer ◽  
Frank B. Kaufman ◽  
Steven R. Kramer ◽  
Ari Aviram
Keyword(s):  
Electron Beam ◽  
Charge Transfer ◽  
High Resolution ◽  
X Ray

scholarly journals High-resolution x-ray crystal spectrometer/polarimeter at torus experiment for technology oriented research-94

2001 ◽  
Vol 72 (6) ◽  
pp. 2566-2574 ◽  
Author(s):  
J. Weinheimer ◽  
I. Ahmad ◽  
O. Herzog ◽  
H.-J. Kunze ◽  
G. Bertschinger ◽  
...  
Keyword(s):  
High Resolution ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Oriented Research

HIGH RESOLUTION L X-RAY EMISSION SPECTRA OF Fe AND Cu INDUCED BY O.75 MeV/u ION IMPACT

1995 ◽  
Vol 05 (02n03) ◽  
pp. 203-209 ◽  
Author(s):  
H. KAGEYAMA ◽  
R. TAKAHASHI ◽  
D. HAMAGUCHI ◽  
T. AWATA ◽  
T. NAKAE ◽  
...  
Keyword(s):  
High Resolution ◽  
Lower Energy ◽  
Emission Spectra ◽  
Crystal Spectrometer ◽  
Transition Energies ◽  
X Ray ◽  
The Difference ◽  
Ion Impact ◽  
Electron Vacancy ◽  
Good Agreement

High resolution L x-ray emission spectra of Fe and Cu have been measured by 0.75 MeV/u H and He, and 0.73 MeV/u He, Si and Ar ion impacts with a crystal spectrometer. The x-ray transition energies in the Fe and Cu targets for Lι, Lη, Lα1,2, Lβ1 and Lβ3,4 diagram lines induced by light ion impacts are determined, which are in good agreement with those given in the reference. The difference in L x-ray emission spectra produced by H, He, Si and Ar ions is considered and the emission spectra for the Cu target are compared with the calculated ones based on the multiconfiguration Dirac-Fock method. The origin of the broadening of the Lα1,2 line to the lower energy for Si and Ar ion impacts is attributed to one 2p plus one 3d electron vacancy production.

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