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Structural analysis of polymer thin films using GISAXS in the tender X-ray region: Concept and design of GISAXS experiments using the tender X-ray energy at BL-15A2 at the Photon Factory
Journal of Applied Physics
◽
10.1063/1.4961977
◽
2016
◽
Vol 120
(14)
◽
pp. 142119
◽
Cited By ~ 6
Author(s):
H. Takagi
◽
N. Igarashi
◽
T. Mori
◽
S. Saijo
◽
Y. Nagatani
◽
...
Keyword(s):
Thin Films
◽
Structural Analysis
◽
Polymer Thin Films
◽
X Ray
◽
Photon Factory
Download Full-text
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Structural Analysis for Surface and Interface of Polymer Thin Films by Synchrotron Radiation X-Ray Scattering Method
Sen i Gakkaishi
◽
10.2115/fiber.72.p-422
◽
2016
◽
Vol 72
(9)
◽
pp. P-422-P-427
Author(s):
RYOHEI ISHIGE
Keyword(s):
Thin Films
◽
Structural Analysis
◽
Synchrotron Radiation
◽
Polymer Thin Films
◽
Scattering Method
◽
X Ray
◽
Surface And Interface
◽
X Ray Scattering
◽
Ray Scattering
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X-ray reflectometer for study of polymer thin films and interfaces
Vacuum
◽
10.1016/0042-207x(90)93984-q
◽
1990
◽
Vol 41
(4-6)
◽
pp. 1441-1444
◽
Cited By ~ 30
Author(s):
M. Foster
◽
M. Stamm
◽
G. Reiter
Keyword(s):
Thin Films
◽
Polymer Thin Films
◽
X Ray
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Diffractive X-ray waveguiding reveals orthogonal crystalline stratification in conjugated polymer thin films
Acta Crystallographica Section A Foundations and Advances
◽
10.1107/s0108767317097847
◽
2017
◽
Vol 73
(a1)
◽
pp. a219-a219
Author(s):
Eliot Gann
◽
Christopher R. McNeill
Keyword(s):
Thin Films
◽
Conjugated Polymer
◽
Polymer Thin Films
◽
X Ray
Download Full-text
3D-structural Analysis of Epitaxially-grown Organic Thin Films by a Newly Developed Energy Dispersive X-ray Diffraction System.
Hyomen Kagaku
◽
10.1380/jsssj.19.259
◽
1998
◽
Vol 19
(4)
◽
pp. 259-264
Author(s):
Kenji ISHIDA
◽
Toshihisa HORIUCHI
◽
Kazumi MATSUSHIGE MATSUSHIGE
Keyword(s):
Thin Films
◽
Structural Analysis
◽
Organic Thin Films
◽
Energy Dispersive
◽
X Ray Diffraction
◽
X Ray
Download Full-text
Structural analysis of ferromagnetic latent tracks in RCo2 thin films (R = Y,Tm,Ce) by means of X-ray diffraction
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
◽
10.1016/0168-583x(95)00799-7
◽
1996
◽
Vol 107
(1-4)
◽
pp. 344-348
◽
Cited By ~ 6
Author(s):
M. Ghidini
◽
J.P. Nozières
◽
D. Givord
◽
A. Liénard
◽
B. Gervais
◽
...
Keyword(s):
Thin Films
◽
Structural Analysis
◽
X Ray Diffraction
◽
X Ray
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Construction of a New VUV∕Soft X-ray Undulator Beamline BL-13A in the Photon Factory for Study of Organic Thin Films and Biomolecules Adsorbed on Surfaces
10.1063/1.3463308
◽
2010
◽
Cited By ~ 8
Author(s):
Kazuhiko Mase
◽
Akio Toyoshima
◽
Takashi Kikuchi
◽
Hirokazu Tanaka
◽
Kenta Amemiya
◽
...
Keyword(s):
Thin Films
◽
Organic Thin Films
◽
X Ray
◽
Photon Factory
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Texture, residual stress and structural analysis of thin films using a combined X-ray analysis
Thin Solid Films
◽
10.1016/j.tsf.2003.10.150
◽
2004
◽
Vol 450
(1)
◽
pp. 34-41
◽
Cited By ~ 281
Author(s):
L. Lutterotti
◽
D. Chateigner
◽
S. Ferrari
◽
J. Ricote
Keyword(s):
Thin Films
◽
Residual Stress
◽
Structural Analysis
◽
X Ray
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Structural properties of π-π conjugated network in polymer thin films studied by x-ray cross-correlation analysis
Journal of Physics Conference Series
◽
10.1088/1742-6596/499/1/012021
◽
2014
◽
Vol 499
◽
pp. 012021
◽
Cited By ~ 4
Author(s):
R P Kurta
◽
L Grodd
◽
E Mikayelyan
◽
O Y Gorobtsov
◽
I Fratoddi
◽
...
Keyword(s):
Thin Films
◽
Correlation Analysis
◽
Structural Properties
◽
Cross Correlation
◽
Polymer Thin Films
◽
X Ray
◽
Cross Correlation Analysis
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Effect of X-ray irradiation on the optical properties of nanostructured thin films TCVA based on structural analysis
Optical and Quantum Electronics
◽
10.1007/s11082-017-1236-8
◽
2017
◽
Vol 49
(12)
◽
Cited By ~ 2
Author(s):
A. A. A. Darwish
◽
Shams A. M. Issa
◽
Taymour A. Hamdalla
◽
M. M. El-Nahass
Keyword(s):
Thin Films
◽
Optical Properties
◽
Structural Analysis
◽
X Ray
◽
Nanostructured Thin Films
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Developing 100 ps-resolved X-ray structural analysis capabilities on beamline NW14A at the Photon Factory Advanced Ring
Journal of Synchrotron Radiation
◽
10.1107/s0909049507025496
◽
2007
◽
Vol 14
(4)
◽
pp. 313-319
◽
Cited By ~ 65
Author(s):
Shunsuke Nozawa
◽
Shin-ichi Adachi
◽
Jun-ichi Takahashi
◽
Ryoko Tazaki
◽
Laurent Guérin
◽
...
Keyword(s):
Structural Analysis
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X Ray
◽
Photon Factory
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