Defect analysis by transmission electron microscopy of epitaxial Al-doped ZnO films grown on (0001) ZnO and a-sapphire by RF magnetron sputtering
Keyword(s):
2001 ◽
Vol 19
(2)
◽
pp. 506
◽
2018 ◽
Vol 93
(4)
◽
pp. 439-447
◽
2008 ◽
Vol E91-C
(10)
◽
pp. 1649-1652
◽
Keyword(s):
2009 ◽
Vol 311
(22)
◽
pp. 4641-4646
◽
2004 ◽
Vol 221
(1-4)
◽
pp. 32-37
◽
Keyword(s):