scholarly journals Characterization of capture cross sections of interface states in dielectric/III-nitride heterojunction structures

2016 ◽  
Vol 119 (20) ◽  
pp. 205304 ◽  
Author(s):  
M. Matys ◽  
R. Stoklas ◽  
J. Kuzmik ◽  
B. Adamowicz ◽  
Z. Yatabe ◽  
...  
Keyword(s):  
Cross Sections ◽  
Interface States ◽  
Capture Cross ◽  
Capture Cross Sections

Characterization of Grain Boundaries in Polycrystalline GaAs

1981 ◽  
Vol 5 ◽  
Author(s):  
Michael G. Spencer ◽  
William J. Schaff ◽  
D. Ken Wagner
Keyword(s):  
Grain Boundary ◽  
Grain Boundaries ◽  
Cross Sections ◽  
Capture Cross ◽  
First Time ◽  
Capture Cross Sections

ABSTRACTExamination of capacitance transients arising from the emission or capture of electrons at a charged GaAs grain boundary reveal for the first time the existence of discrete interface levels. The position of these levels in the bandgap and their associated capture cross sections are determined from the transients.

scholarly journals Characterization of 4H-SiC Junction Barrier Schottky Diodes by Admittance vs Temperature Analyses

2009 ◽  
Vol 615-617 ◽  
pp. 671-674
Author(s):  
Christophe Raynaud ◽  
Duy Minh Nguyen ◽  
Pierre Brosselard ◽  
Amador Pérez-Tomás ◽  
Dominique Planson ◽  
...  
Keyword(s):  
Cross Sections ◽  
Doping Level ◽  
Schottky Diodes ◽  
Admittance Spectroscopy ◽  
Capture Cross ◽  
Interfacial Defects ◽  
Capacitance Voltage ◽  
Implantation Process ◽  
Capture Cross Sections

Schottky barrier diodes and junction barrier Schottky diodes are investigated by thermal admittance spectroscopy, and by Capacitance-Voltage measurements. Samples are protected with surrounding junction termination extension and p+ ring. Temperature dependence of the doping level is first calculated. Then admittance spectra allow detecting defects and extracting their activation energies and capture cross sections. Results seem to indicate the presence of interfacial defects and defects due to the implantation process.

THERMAL NEUTRON CAPTURE CROSS-SECTION OF Na23 AND Mn55

1953 ◽  
Vol 31 (3) ◽  
pp. 204-206 ◽  
Author(s):  
Rosalie M. Bartholomew ◽  
R. C. Hawkings ◽  
W. F. Merritt ◽  
L. Yaffe
Keyword(s):  
Thermal Neutron ◽  
Cross Section ◽  
Cross Sections ◽  
Neutron Capture ◽  
Half Life ◽  
Capture Cross Section ◽  
Thermal Neutron Capture ◽  
Capture Cross ◽  
Neutron Capture Cross Section ◽  
Capture Cross Sections

The thermal neutron capture cross sections of Na23 and Mn55 have been determined using the activation method. The values are 0.53 ± 0.03 and 12.7 ± 0.3 barns respectively with respect to σAul97 = 93 barns. These agree well with recent pile oscillator results. The half-life for Mn56 is found to be 2.576 ± 0.002 hr.

Capture Cross Sections for Negative Ions in Rotating Helium II

1965 ◽  
Vol 14 (15) ◽  
pp. 585-587 ◽  
Author(s):  
B. E. Springett ◽  
D. J. Tanner ◽  
R. J. Donnelly
Keyword(s):  
Cross Sections ◽  
Negative Ions ◽  
Capture Cross ◽  
Helium Ii ◽  
Capture Cross Sections
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