scholarly journals Electron energy loss spectroscopy of excitons in two-dimensional-semiconductors as a function of temperature

2016 ◽  
Vol 108 (16) ◽  
pp. 163107 ◽  
Author(s):  
Luiz H. G. Tizei ◽  
Yung-Chang Lin ◽  
Ang-Yu Lu ◽  
Lain-Jong Li ◽  
Kazu Suenaga
2020 ◽  
Vol 6 (28) ◽  
pp. eabb4713
Author(s):  
Renwen Yu ◽  
F. Javier García de Abajo

We explore a disruptive approach to nanoscale sensing by performing electron energy loss spectroscopy through the use of low-energy ballistic electrons that propagate on a two-dimensional semiconductor. In analogy to free-space electron microscopy, we show that the presence of analyte molecules in the vicinity of the semiconductor produces substantial energy losses in the electrons, which can be resolved by energy-selective electron injection and detection through actively controlled potential gates. The infrared excitation spectra of the molecules are thereby gathered in this electronic device, enabling the identification of chemical species with high sensitivity. Our realistic theoretical calculations demonstrate the superiority of this technique for molecular sensing, capable of performing spectral identification at the zeptomol level within a microscopic all-electrical device.


2012 ◽  
Vol 112 (2) ◽  
pp. 024105 ◽  
Author(s):  
R. E. Moctezuma ◽  
J. F. Nossa ◽  
A. Camacho ◽  
J. L. Carrillo ◽  
J. M. Rubí

1999 ◽  
Vol 5 (S2) ◽  
pp. 614-615
Author(s):  
R.R. Vanfleet ◽  
D. Muller ◽  
H.-J. Gossmann ◽  
J. Silcox

MBE techniques allow the fabrication of exceptionally sharp compositional changes such as delta doped layers in semiconductors. Producing these spatially confined doped layers is critical to many innovative device designs. The spatial confinement of these delta doped structures can be less than the measurement resolution of the currently standard SIMS and RBS techniques. This allows only the upper limits on the layer width to be measured. These SIMS and RBS methods are also inadequate for the two dimensional information desired for future device design and development. More recently developed techniques such as Scanning Capacitance Microscopy and spreading resistance measurement give two dimensional information but have similar spatial resolution issues. The Z-contrast nature of Annular Dark Field (ADF) imaging with the complimentary technique of Electron Energy Loss Spectroscopy (EELS) in the Scanning Transmission Electron Microscope (STEM) shows promise for two dimensional dopant profiling with spatial resolution on the atomic scale.


2016 ◽  
Vol 120 (20) ◽  
pp. 11170-11179 ◽  
Author(s):  
Kulpreet S. Virdi ◽  
Yaron Kauffmann ◽  
Christian Ziegler ◽  
Pirmin Ganter ◽  
Peter Blaha ◽  
...  

1984 ◽  
Vol 29 (5) ◽  
pp. 2458-2468 ◽  
Author(s):  
J. I. Gersten ◽  
I. Wagner ◽  
A. Rosenthal ◽  
Y. Goldstein ◽  
A. Many ◽  
...  

Author(s):  
P. Trebbia ◽  
P. Ballongue ◽  
C. Colliex

An effective use of electron energy loss spectroscopy for chemical characterization of selected areas in the electron microscope can only be achieved with the development of quantitative measurements capabilities.The experimental assembly, which is sketched in Fig.l, has therefore been carried out. It comprises four main elements.The analytical transmission electron microscope is a conventional microscope fitted with a Castaing and Henry dispersive unit (magnetic prism and electrostatic mirror). Recent modifications include the improvement of the vacuum in the specimen chamber (below 10-6 torr) and the adaptation of a new electrostatic mirror.The detection system, similar to the one described by Hermann et al (1), is located in a separate chamber below the fluorescent screen which visualizes the energy loss spectrum. Variable apertures select the electrons, which have lost an energy AE within an energy window smaller than 1 eV, in front of a surface barrier solid state detector RTC BPY 52 100 S.Q. The saw tooth signal delivered by a charge sensitive preamplifier (decay time of 5.10-5 S) is amplified, shaped into a gaussian profile through an active filter and counted by a single channel analyser.


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