Interface properties of Si-SiO2-Ta2O5 structure by cathodoluminescence spectroscopy

2016 ◽  
Vol 119 (5) ◽  
pp. 055307 ◽  
Author(s):  
A. P. Baraban ◽  
V. A. Dmitriev ◽  
V. E. Drozd ◽  
V. A. Prokofiev ◽  
S. N. Samarin ◽  
...  
Keyword(s):  
Interface Properties ◽  
Cathodoluminescence Spectroscopy

scholarly journals Single Particle Cathodoluminescence Spectroscopy with Sub-20 nm, Electron-Stable Phosphors

ACS Photonics ◽  
2021 ◽  
Author(s):  
Dayne F. Swearer ◽  
Stefan Fischer ◽  
Daniel K. Angell ◽  
Chris Siefe ◽  
A. Paul Alivisatos ◽  
...  
Keyword(s):  
Single Particle ◽  
Cathodoluminescence Spectroscopy ◽  
20 Nm

Interface properties and valence-band discontinuity of MnS/ZnSe heterostructures

1996 ◽  
Vol 54 (4) ◽  
pp. 2718-2722 ◽  
Author(s):  
L. Wang ◽  
S. Sivananthan ◽  
R. Sporken ◽  
R. Caudano
Keyword(s):  
Valence Band ◽  
Interface Properties ◽  
Valence Band Discontinuity

Nanometer-Scale Stress Field Evaluation of Cu∕ILD Structure by Cathodoluminescence Spectroscopy

2007 ◽  
Author(s):  
Masako Kodera ◽  
Sachiyo Ito ◽  
Masahiko Hasunuma ◽  
Shigeru Kakinuma ◽  
Shinichi Ogawa ◽  
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Keyword(s):  
Stress Field ◽  
Field Evaluation ◽  
Nanometer Scale ◽  
Cathodoluminescence Spectroscopy

Influence of the electrical interface properties on the rheological behavior of sonicated soy lecithin dispersions

2007 ◽  
Vol 309 (2) ◽  
pp. 279-282 ◽  
Author(s):  
M.A. Alvarez ◽  
D. Seyler ◽  
S. Madrigal-Carballo ◽  
A.O. Vila ◽  
F. Molina
Keyword(s):  
Rheological Behavior ◽  
Interface Properties ◽  
Soy Lecithin
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