Cooperative effect of oxygen-vacancy-rich layer and ferroelectric polarization on photovoltaic properties in BiFeO3 thin film capacitors

2016 ◽  
Vol 108 (3) ◽  
pp. 032901 ◽  
Author(s):  
Hiroki Matsuo ◽  
Yuuki Kitanaka ◽  
Ryotaro Inoue ◽  
Yuji Noguchi ◽  
Masaru Miyayama
2013 ◽  
Vol 91 ◽  
pp. 359-361 ◽  
Author(s):  
Wen Dong ◽  
Yiping Guo ◽  
Bing Guo ◽  
Hongyan Liu ◽  
Hua Li ◽  
...  

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Yi-Jun XIE ◽  
Yi-Ping GUO ◽  
Wen DONG ◽  
Bing GUO ◽  
Hua LI ◽  
...  

2015 ◽  
Vol 117 (20) ◽  
pp. 204103 ◽  
Author(s):  
Boyuan Zhao ◽  
Zhihui Chen ◽  
Jianwei Meng ◽  
Hongliang Lu ◽  
David Wei Zhang ◽  
...  

2003 ◽  
Vol 784 ◽  
Author(s):  
Dal-Hyun Do ◽  
Dong Min Kim ◽  
Chang-Beom Eom ◽  
Eric M. Dufresne ◽  
Eric D. Isaacs ◽  
...  

ABSTRACTThe evolution of stored ferroelectric polarization in PZT thin film capacitors was imaged using synchrotron x-ray microdiffraction with a submicron-diameter focused incident x-ray beam. To form the capacitors, an epitaxial Pb(Zr,Ti)O3 (PZT) thin film was deposited on an epitaxially-grown conductive SrRuO3 (SRO) bottom electrode on a SrTiO3 (STO) (001) substrate. Polycrystalline SRO or Pt top electrodes were prepared by sputter deposition through a shadow mask and subsequent annealing. The intensity of x-ray reflections from the PZT film depended on the local ferroelectric polarization. With 10 keV x-rays, regions of opposite polarization differed in intensity by 26% in our PZT capacitor with an SRO top electrode. Devices with SRO electrodes showed just a 25% decrease in the remnant polarization after 107 switching cycles. In devices with Pt top electrodes, however, the switchable polarization decreased a by 70% after only 5×104 cycles.


2008 ◽  
Vol 92 (12) ◽  
pp. 122903 ◽  
Author(s):  
Guo-Zhen Liu ◽  
Can Wang ◽  
Chun-Chang Wang ◽  
Jie Qiu ◽  
Meng He ◽  
...  

2014 ◽  
Vol 72 (1) ◽  
pp. 74-79 ◽  
Author(s):  
Yin’e Zhou ◽  
Benfang Yu ◽  
Xiaoyan Zhu ◽  
Xinyu Tan ◽  
Lihua Qian ◽  
...  

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