scholarly journals Piezoresponse force microscopy study on ferroelectric polarization of ferroelectric polymer thin films with various structural configurations

AIP Advances ◽  
2015 ◽  
Vol 5 (9) ◽  
pp. 097211 ◽  
Author(s):  
Zongyuan Fu ◽  
Jianchi Zhang ◽  
Junhui Weng ◽  
Weibo Chen ◽  
Yulong Jiang ◽  
...  
Keyword(s):  
Thin Films ◽  
Polymer Thin Films ◽  
Piezoresponse Force Microscopy ◽  
Microscopy Study ◽  
Ferroelectric Polarization ◽  
Force Microscopy ◽  
Ferroelectric Polymer ◽  
Structural Configurations

Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3830-3833 ◽  
Author(s):  
Takeshi Fukuma ◽  
Kei Kobayashi ◽  
Toshihisa Horiuchi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Polymer Thin Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Ferroelectric Polymer ◽  
Atomic Force ◽  
Scale Characterization

Atomic force microscopy study of small-size nanotubular polymer thin films

1999 ◽  
Vol 14 (3) ◽  
pp. 1084-1090 ◽  
Author(s):  
C. F. Zhu ◽  
I. Lee ◽  
J. W. Li ◽  
C. Wang ◽  
X. Y. Cao ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Dynamics ◽  
Atomic Force Microscopy ◽  
Room Temperature ◽  
Polymer Thin Films ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force

In this paper, we report atomic force microscopy (AFM) images of a tubular polymer and its supermolecular polymer thin films, operated in contact mode at room temperature in air. The configuration models are also calculated using molecular dynamics. The diameter of the polymer nanotube is about 0.7 nm, the smallest size a tube can have. The results of calculation agree with the experimental results.

Characterization of Nanomechanical, Ferroelectric, and Piezoelectric Properties by Nanoindentation and Piezoresponse Force Microscopy of PbTiO3 Thin Films

2013 ◽  
Vol 52 (40) ◽  
pp. 14328-14334 ◽  
Author(s):  
Juan Ramos-Cano ◽  
Mario Miki-Yoshida ◽  
André Marino Gonçalves ◽  
José Antônio Eiras ◽  
Jesús González-Hernández ◽  
...  
Keyword(s):  
Thin Films ◽  
Piezoelectric Properties ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Ferroelectric And Piezoelectric Properties

Three-dimensional ferroelectric domain imaging of epitaxial BiFeO3 thin films using angle-resolved piezoresponse force microscopy

2010 ◽  
Vol 97 (11) ◽  
pp. 112907 ◽  
Author(s):  
Moonkyu Park ◽  
Seungbum Hong ◽  
Jeffrey A. Klug ◽  
Michael J. Bedzyk ◽  
Orlando Auciello ◽  
...  
Keyword(s):  
Thin Films ◽  
Three Dimensional ◽  
Piezoresponse Force Microscopy ◽  
Ferroelectric Domain ◽  
Force Microscopy ◽  
Bifeo3 Thin Films

Piezoresponse Force Microscopy Studies of pc-BiFeO3 Thin Films Produced by the Simultaneous Laser Ablation of Bi and FeO3

2012 ◽  
Vol 1477 ◽  
Author(s):  
C. I. Enriquez-Flores ◽  
J. J. Gervacio-Arciniega ◽  
F. J. Flores-Ruiz ◽  
D. Cardona ◽  
E. Camps ◽  
...  
Keyword(s):  
Thin Films ◽  
Pulsed Laser ◽  
Domain Size ◽  
Piezoresponse Force Microscopy ◽  
Laser Deposition ◽  
Bismuth Iron Oxide ◽  
Deposition Technique ◽  
Force Microscopy ◽  
Bifeo3 Thin Films ◽  
Ferroelectric Domains

ABSTRACTBismuth iron oxide BFO films were produced by the pulsed laser deposition technique. These films are a mixture of BiFeO3 ferroelectrical and Bi25FeO40 piezoelectrical phases. The ferroelectrical domain structure of these films was studied via contact resonance piezoresponse force microscopy (CR-PFM) and resonance tracking PFM (RT-PFM). The proportions of area of these BFO phases were derived from the PFM images. The ferroelectrical domain size corresponds to the size of the BiFeO3 crystals. The CR-PFM and RT-PFM techniques allowed us to be able to distinguish between the ferroelectric domains and the piezoelectric regions existing in the polycrystalline films.

Direct characterization of nanoscale domain switching and local piezoelectric loops of (Pb,La)TiO3 thin films by piezoresponse force microscopy

2005 ◽  
Vol 81 (6) ◽  
pp. 1207-1212 ◽  
Author(s):  
R. Poyato ◽  
M.L. Calzada ◽  
V.V. Shvartsman ◽  
A. Kholkin ◽  
P. Vilarinho ◽  
...  
Keyword(s):  
Thin Films ◽  
Domain Switching ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy
Sign in / Sign up

Export Citation Format

Share Document