Electron channeling contrast imaging of anti-phase boundaries in coherently strained La0.7Sr0.3MnO3 thin films on (110)-oriented SrTiO3

2015 ◽  
Vol 107 (4) ◽  
pp. 041601 ◽  
Author(s):  
Miaolei Yan ◽  
Marc De Graef ◽  
Yoosuf N. Picard ◽  
Paul A. Salvador
Keyword(s):  
Thin Films ◽  
Contrast Imaging ◽  
Phase Boundaries ◽  
Electron Channeling

Rapid misfit dislocation characterization in heteroepitaxial III-V/Si thin films by electron channeling contrast imaging

2014 ◽  
Vol 104 (23) ◽  
pp. 232111 ◽  
Author(s):  
Santino D. Carnevale ◽  
Julia I. Deitz ◽  
John A. Carlin ◽  
Yoosuf N. Picard ◽  
Marc De Graef ◽  
...  
Keyword(s):  
Thin Films ◽  
Misfit Dislocation ◽  
Contrast Imaging ◽  
Electron Channeling

scholarly journals Defect Analysis in La0.7Sr0.3MnO3 Epitaxial Thin Films by Electron Channeling Contrast Imaging (ECCI)

2014 ◽  
Vol 20 (S3) ◽  
pp. 1036-1037
Author(s):  
Miaolei Yan ◽  
Marc De Graef ◽  
Yoosuf N. Picard ◽  
Paul A. Salvador
Keyword(s):  
Thin Films ◽  
Epitaxial Thin Films ◽  
Defect Analysis ◽  
Contrast Imaging ◽  
Electron Channeling

Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films

2008 ◽  
Vol 14 (S2) ◽  
pp. 1194-1195 ◽  
Author(s):  
C Trager-Cowan ◽  
F Sweeney ◽  
PR Edwards ◽  
FL Dynowski ◽  
AJ Wilkinson ◽  
...  
Keyword(s):  
Thin Films ◽  
New Mexico ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Ion Channeling

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

scholarly journals Using Electron Channeling Contrast Imaging for Misfit Dislocation Characterization in Heteroepitaxial III-V/Si Thin Films

2014 ◽  
Vol 20 (S3) ◽  
pp. 552-553
Author(s):  
Julia Deitz ◽  
Santino Carnevale ◽  
Marc De Graef ◽  
Yoosuf N. Picard ◽  
Stephen A. Ringel ◽  
...  
Keyword(s):  
Thin Films ◽  
Misfit Dislocation ◽  
Contrast Imaging ◽  
Electron Channeling

Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films

2012 ◽  
Vol 18 (S2) ◽  
pp. 684-685 ◽  
Author(s):  
C. Trager-Cowan ◽  
G. Naresh-Kumar ◽  
B. Hourahine ◽  
P.R. Edwards ◽  
J. Bruckbauer ◽  
...  
Keyword(s):  
Thin Films ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Semiconductor Thin Films ◽  
Nitride Semiconductor

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterization of Nitride Thin Films by Electron Backscatter Diffraction and Electron Channeling Contrast Imaging

2005 ◽  
Vol 892 ◽  
Author(s):  
Carol Trager-Cowan ◽  
Francis Sweeney ◽  
A J Wilkinson ◽  
P W Trimby ◽  
A. P. Day ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Backscatter Diffraction ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Electron Backscatter ◽  
Backscatter Diffraction

scholarly journals Alkali-deficiency driven charged out-of-phase boundaries for giant electromechanical response

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Haijun Wu ◽  
Shoucong Ning ◽  
Moaz Waqar ◽  
Huajun Liu ◽  
Yang Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Temperature Stability ◽  
Epitaxial Films ◽  
Polarization Rotation ◽  
Phase Boundaries ◽  
Film Properties ◽  
New Strategy ◽  
The Matrix ◽  
Opposing Effects ◽  
Severe Deterioration

AbstractTraditional strategies for improving piezoelectric properties have focused on phase boundary engineering through complex chemical alloying and phase control. Although they have been successfully employed in bulk materials, they have not been effective in thin films due to the severe deterioration in epitaxy, which is critical to film properties. Contending with the opposing effects of alloying and epitaxy in thin films has been a long-standing issue. Herein we demonstrate a new strategy in alkali niobate epitaxial films, utilizing alkali vacancies without alloying to form nanopillars enclosed with out-of-phase boundaries that can give rise to a giant electromechanical response. Both atomically resolved polarization mapping and phase field simulations show that the boundaries are strained and charged, manifesting as head-head and tail-tail polarization bound charges. Such charged boundaries produce a giant local depolarization field, which facilitates a steady polarization rotation between the matrix and nanopillars. The local elastic strain and charge manipulation at out-of-phase boundaries, demonstrated here, can be used as an effective pathway to obtain large electromechanical response with good temperature stability in similar perovskite oxides.

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