scholarly journals Application of x-ray absorption fine structure (XAFS) to local-order analysis in Fe-Cr maghemite-like materials

2015 ◽  
Author(s):  
M. E. Montero-Cabrera ◽  
L. E. Fuentes-Cobas ◽  
E. Macías-Ríos ◽  
M. E. Fuentes-Montero
Keyword(s):  
Fine Structure ◽  
Local Order ◽  
X Ray ◽  
Order Analysis ◽  
Absorption Fine ◽  
X Ray Absorption

scholarly journals On the local order of amorphous La2Mo2O6.7

2017 ◽  
Vol 46 (22) ◽  
pp. 7273-7283 ◽  
Author(s):  
Jesús Vega-Castillo ◽  
Gaëtan Buvat ◽  
Gwenaël Corbel ◽  
Abdelhadi Kassiba ◽  
Philippe Lacorre ◽  
...  
Keyword(s):  
Fine Structure ◽  
Structure Analysis ◽  
Amorphous Material ◽  
Electronic Paramagnetic Resonance ◽  
Local Order ◽  
Paramagnetic Resonance ◽  
X Ray ◽  
Absorption Fine ◽  
Local Arrangement ◽  
X Ray Absorption

Extended X-ray absorption fine structure analysis has been carried out and complemented with electronic paramagnetic resonance to model the local arrangement around Mo in this amorphous material.

scholarly journals Near-Edge X-Ray Absorption Fine Structure Examination of Chemical Bonding in Sputter Deposited Boron and Boron-Nitride Films

1996 ◽  
Vol 437 ◽  
Author(s):  
A.F. Jankowski ◽  
I. Jimenez ◽  
J.P. Hayes ◽  
D.K. Shuh ◽  
W.M. Tong ◽  
...  
Keyword(s):  
Fine Structure ◽  
Boron Nitride ◽  
Chemical Bonding ◽  
Local Order ◽  
X Ray ◽  
Absorption Fine ◽  
Sputter Deposited ◽  
X Ray Absorption ◽  
Boron Nitride Films ◽  
Distinguishing Features

AbstractNear-edge x-ray absorption fine structure (NEXAFS) is used to examine the chemical bonding in boron and boron-nitride films sputter deposited from a fully-dense, pure boron target. Reactive sputtering is used to prepare the boron-nitride and multilayered films. Although the process of sputter deposition often produces films that lack long range order, NEXAFS reveals the distinguishing features of sp2 and sp3 hybridization that are associated with different crystalline structures. The sensitivity of NEXAFS to local order further provides details in bonding modifications that exist in these films.

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