Phosphorus and boron diffusion paths in polycrystalline silicon gate of a trench-type three-dimensional metal-oxide-semiconductor field effect transistor investigated by atom probe tomography
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2021 ◽
Vol 134
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pp. 106046
2011 ◽
Vol 50
(4S)
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pp. 04DL05
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2011 ◽
Vol 50
(11R)
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pp. 110210
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