Apertureless scanning microscope probe as a detector of semiconductor laser emission

2015 ◽  
Vol 106 (17) ◽  
pp. 171105 ◽  
Author(s):  
Mikhail Dunaevskiy ◽  
Anton Dontsov ◽  
Prokhor Alekseev ◽  
Andrei Monakhov ◽  
Alexei Baranov ◽  
...  
Keyword(s):  
Semiconductor Laser ◽  
Laser Emission ◽  
Scanning Microscope ◽  
Microscope Probe

Tunable stiffness scanning microscope probe

2004 ◽  
Author(s):  
Clemens Mueller-Falcke ◽  
Yong-Ak Song ◽  
Sang-Gook Kim
Keyword(s):  
Scanning Microscope ◽  
Stiffness Scanning ◽  
Tunable Stiffness ◽  
Microscope Probe

Speckle characteristics of a laser projector using nonmodal laser emission of a semiconductor laser

2010 ◽  
Author(s):  
Gordon M. J. Craggs ◽  
Falko Riechert ◽  
Youri Meuret ◽  
Hugo Thienpont ◽  
Jan Danckaert ◽  
...  
Keyword(s):  
Semiconductor Laser ◽  
Laser Emission ◽  
Laser Projector

Electric Field Induced Light Emission and Conductance-Loss Transients in Liquid Anthracene

1974 ◽  
Vol 52 (20) ◽  
pp. 3559-3561 ◽  
Author(s):  
Kyoji Shinsaka ◽  
Gordon R. Freeman
Keyword(s):  
Electrical Conductivity ◽  
Electric Field ◽  
Semiconductor Laser ◽  
Laser Emission ◽  
Light Emission ◽  
Average Frequency ◽  
Frequency Of Occurrence ◽  
High Electrical Conductivity ◽  
Field Strengths

Liquid anthracene has an unusually high electrical conductivity for a hydrocarbon, being 2 × 10−1 mho cm−1 at 507 K. At electric field strengths above 3 kV/cm the conductance suffers transient decreases that last <3 μs and are irregularly spaced in time. The average frequency of occurrence and magnitude of the transients increase rapidly with increasing field above the threshold. The conductance loss transients are accompanied by emission of light. These phenomena may be related to that of semiconductor laser emission.

scholarly journals Моделирование оптимальной оптической системы ввода/вывода излучения для реализации эффективного зондового усиления электромагнитного поля для случая непрозрачных образцов

2021 ◽  
Vol 47 (5) ◽  
pp. 42
Author(s):  
М.А. Трусов ◽  
А.Е. Ефимов ◽  
Д.О. Соловьева ◽  
И.С. Васкан ◽  
В.А. Олейников ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Optical System ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Optical Scheme ◽  
Scanning Microscope ◽  
Scattering Intensity ◽  
Probe Microscope ◽  
Scattering Signal ◽  
Microscope Probe

Competitive schemes for constructing an optical system for combining a scanning probe microscope and optical microspectrometer, allowing the study of opaque samples by the method of  tip enhancement of the Raman scattering intensity, are considered. Optimal objectives for the implementation of each scheme, taking into account the presence of a scanning microscope probe, are selected. The efficiency of usage of each optical scheme is estimated quantitatively for both excitation of a Raman scattering signal and collecting secondary radiation. As a result, the most effective optical system in terms of "excitation / collection“ parameter is revealed.

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