Continuous refractive index dispersion measurement based on derivative total reflection method

2015 ◽  
Vol 86 (4) ◽  
pp. 043101 ◽  
Author(s):  
Zhichao Deng ◽  
Jin Wang ◽  
Qing Ye ◽  
Tengqian Sun ◽  
Wenyuan Zhou ◽  
...  
Keyword(s):  
Refractive Index ◽  
Total Reflection ◽  
Reflection Method ◽  
Refractive Index Dispersion ◽  
Dispersion Measurement

scholarly journals Refractive index dispersion measurement using carrier-envelope phasemeters

2017 ◽  
Vol 19 (2) ◽  
pp. 023040 ◽  
Author(s):  
Peter Hansinger ◽  
Philipp Töpfer ◽  
Nikolay Dimitrov ◽  
Daniel Adolph ◽  
Dominik Hoff ◽  
...  
Keyword(s):  
Refractive Index ◽  
Refractive Index Dispersion ◽  
Dispersion Measurement

Study of dynamic pressure-induced refractive index change using derivative total reflection method

2013 ◽  
Vol 18 (11) ◽  
pp. 117005 ◽  
Author(s):  
Jin Wang ◽  
Qing Ye ◽  
Zhichao Deng ◽  
Tengqian Sun ◽  
Wenyuan Zhou ◽  
...  
Keyword(s):  
Refractive Index ◽  
Dynamic Pressure ◽  
Refractive Index Change ◽  
Total Reflection ◽  
Reflection Method ◽  
Index Change

A Scanning Total Reflection Method for Refractive-Index Profiling

1989 ◽  
Vol 28 (Part 1, No. 8) ◽  
pp. 1497-1500
Author(s):  
Xiaofan Zhu ◽  
Kenichi Iga
Keyword(s):  
Refractive Index ◽  
Total Reflection ◽  
Reflection Method

Measurement of the complex refractive index of tissue-mimicking phantoms and biotissue by extended differential total reflection method

2011 ◽  
Vol 16 (9) ◽  
pp. 097001 ◽  
Author(s):  
Qing Ye ◽  
Jin Wang ◽  
Zhi-Chao Deng ◽  
Wen-Yuan Zhou ◽  
Chun-Ping Zhang ◽  
...  
Keyword(s):  
Refractive Index ◽  
Complex Refractive Index ◽  
Total Reflection ◽  
Reflection Method

scholarly journals The reflection of long X-rays

1931 ◽  
Vol 133 (821) ◽  
pp. 292-303 ◽  
Keyword(s):  
Refractive Index ◽  
Plane Surface ◽  
Short Wave ◽  
Total Reflection ◽  
Refractive Indices ◽  
X Rays ◽  
Reflection Method ◽  
Glancing Angle ◽  
Matter Theory ◽  
Theory And Experiment

Introduction .—For X-rays passing through matter, theory and experiment give a refractive index μ slightly less than unity, so that if a beam of X-rays falls on the plane surface of a solid at a small glancing angle less than the critical glancing angle, it is totally reflected. Determinations of the refractive indices of short wave X-rays by the total reflection method have been carried out by a considerable number of observers. The work of Forster and of Doan is of particular importance in that determinations have been made with many refinements of technique for various substances over a range of wave-lengths.

Sign in / Sign up

Export Citation Format

Share Document