scholarly journals Uniaxial and tensile strained germanium nanomembranes in rolled-up geometry by polarized Raman scattering spectroscopy

AIP Advances ◽  
2015 ◽  
Vol 5 (3) ◽  
pp. 037115 ◽  
Author(s):  
Qinglei Guo ◽  
Miao Zhang ◽  
Zhongying Xue ◽  
Jing Zhang ◽  
Gang Wang ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Raman Scattering Spectroscopy ◽  
Polarized Raman

scholarly journals Determining Strain, Chemical Composition, and Thermal Properties of Si/SiGe Nanostructures via Raman Scattering Spectroscopy

2018 ◽  
Author(s):  
Leonid Tsybeskov ◽  
Selina A. Mala ◽  
Xialou Wang ◽  
Jean-Marc Baribeau ◽  
Xiaohua Wu ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Raman Spectroscopy ◽  
Chemical Composition ◽  
Raman Scattering ◽  
Optoelectronic Devices ◽  
Low Frequency ◽  
Spectral Features ◽  
Raman Scattering Spectroscopy ◽  
Inelastic Light Scattering ◽  
Polarized Raman

Studies by Raman spectroscopy of two kinds of Si/SiGenanostructures—quantum dot multilayers and planarsuperlattices—reveal a wide variety of spectral features including first- and second-order Raman scattering, polarized Raman scattering, and low-frequency inelastic light scattering associated with folded acoustic phonons. Here we overview how such features can be employed to semi-quantitatively analyze the strain, chemical composition, and thermal conductivity in these industrially important materials that are widely used for producing electronic and optoelectronic devices.

scholarly journals A large-solid-angle X-ray Raman scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

2017 ◽  
Vol 24 (2) ◽  
pp. 521-530 ◽  
Author(s):  
S. Huotari ◽  
Ch. J. Sahle ◽  
Ch. Henriquet ◽  
A. Al-Zein ◽  
K. Martel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Raman Scattering ◽  
Solid Angle ◽  
European Synchrotron Radiation Facility ◽  
Electronic Excitations ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Area Detector ◽  
Spectroscopic Tool

An end-station for X-ray Raman scattering spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility is described. This end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering. The spectrometer has 72 spherically bent analyzer crystals arranged in six modular groups of 12 analyzer crystals each for a combined maximum flexibility and large solid angle of detection. Each of the six analyzer modules houses one pixelated area detector allowing for X-ray Raman scattering based imaging and efficient separation of the desired signal from the sample and spurious scattering from the often used complicated sample environments. This new end-station provides an unprecedented instrument for X-ray Raman scattering, which is a spectroscopic tool of great interest for the study of low-energy X-ray absorption spectra in materials under in situ conditions, such as in operando batteries and fuel cells, in situ catalytic reactions, and extreme pressure and temperature conditions.

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