Determining Strain, Chemical Composition, and Thermal Properties of Si/SiGe Nanostructures via Raman Scattering Spectroscopy
Keyword(s):
Studies by Raman spectroscopy of two kinds of Si/SiGenanostructures—quantum dot multilayers and planarsuperlattices—reveal a wide variety of spectral features including first- and second-order Raman scattering, polarized Raman scattering, and low-frequency inelastic light scattering associated with folded acoustic phonons. Here we overview how such features can be employed to semi-quantitatively analyze the strain, chemical composition, and thermal conductivity in these industrially important materials that are widely used for producing electronic and optoelectronic devices.
2010 ◽
Vol 470
(20)
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pp. 1021-1024
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Keyword(s):
2019 ◽
Vol 17
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pp. 143-148
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2015 ◽
Vol 3
(38)
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pp. 10007-10016
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Keyword(s):