Direct observation of electron emission and recombination processes by time domain measurements of charge pumping current

Masahiro Hori; Tokinobu Watanabe; Toshiaki Tsuchiya; Yukinori Ono

doi:10.1063/1.4906997

Direct observation of electron emission and recombination processes by time domain measurements of charge pumping current

Applied Physics Letters ◽

10.1063/1.4906997 ◽

2015 ◽

Vol 106 (4) ◽

pp. 041603 ◽

Cited By ~ 5

Author(s):

Masahiro Hori ◽

Tokinobu Watanabe ◽

Toshiaki Tsuchiya ◽

Yukinori Ono

Keyword(s):

Direct Observation ◽

Time Domain ◽

Electron Emission ◽

Charge Pumping ◽

Recombination Processes

Download Full-text

Direct observation of electron capture and emission processes by the time domain charge pumping measurement of MoS2 FET

Applied Physics Letters ◽

10.1063/1.5048099 ◽

2018 ◽

Vol 113 (13) ◽

pp. 133505 ◽

Cited By ~ 4

Author(s):

Koki Taniguchi ◽

Nan Fang ◽

Kosuke Nagashio

Keyword(s):

Electron Capture ◽

Direct Observation ◽

Time Domain ◽

Charge Pumping ◽

The Time Domain

Download Full-text

An improved time domain analysis of the charge pumping current

Journal of Non-Crystalline Solids ◽

10.1016/s0022-3093(00)00382-3 ◽

2001 ◽

Vol 280 (1-3) ◽

pp. 255-260 ◽

Cited By ~ 12

Author(s):

P. Masson ◽

J.-L. Autran ◽

G. Ghibaudo

Keyword(s):

Time Domain ◽

Time Domain Analysis ◽

Domain Analysis ◽

Charge Pumping

Download Full-text

Direct observation of correlation between electron emission and fragmentation into ions following B 1sexcitation of theBF3molecule

Physical Review A ◽

10.1103/physreva.52.r1815 ◽

1995 ◽

Vol 52 (3) ◽

pp. R1815-R1818 ◽

Cited By ~ 35

Author(s):

K. Ueda ◽

K. Ohmori ◽

M. Okunishi ◽

H. Chiba ◽

Y. Shimizu ◽

...

Keyword(s):

Direct Observation ◽

Electron Emission

Download Full-text

Direct observation of optical magnetism from a dielectric resonator metamaterial using time-domain spectroscopy in the mid-infrared

IEEE Photonics Conference 2012 ◽

10.1109/ipcon.2012.6358857 ◽

2012 ◽

Author(s):

Sheng Liu ◽

Igal Brener ◽

Thomas S. Mahony ◽

James Ginn ◽

Daniel A. Bender ◽

...

Keyword(s):

Direct Observation ◽

Time Domain ◽

Dielectric Resonator ◽

Mid Infrared ◽

Time Domain Spectroscopy

Download Full-text

Charge Pumping Current from Single Si/SiO2 Interface Traps: Direct Observation of Pb Centers and Fundamental Trap-Counting by the Charge Pumping Method

10.7567/ssdm.2014.j-2-5l ◽

2014 ◽

Author(s):

T. Tsuchiya ◽

Y. Ono

Keyword(s):

Direct Observation ◽

Interface Traps ◽

Charge Pumping

Download Full-text

Combined Effect of Secondary Electron Emission, Plasma Ion and Electron Number Density Variation due to Dust Charging and Ionization-Recombination Processes on Dust Ion Acoustic Wave Propagation

Physica Scripta ◽

10.1238/physica.regular.071a00298 ◽

2005 ◽

Vol 71 (3) ◽

pp. 298-302 ◽

Cited By ~ 11

Author(s):

M R Gupta ◽

Susmita Sarkar ◽

Banamali Roy ◽

Anupam Karmakar ◽

Manoranjan Khan

Keyword(s):

Electron Emission ◽

Electron Number Density ◽

Secondary Electron Emission ◽

Density Variation ◽

Number Density ◽

Acoustic Wave Propagation ◽

Electron Number ◽

Ion Acoustic Wave ◽

Recombination Processes ◽

Dust Charging

Download Full-text

Direct observation of conduction-band structure of4H- and6H−SiCusing ballistic electron emission microscopy

Physical Review B ◽

10.1103/physrevb.57.4027 ◽

1998 ◽

Vol 57 (7) ◽

pp. 4027-4032 ◽

Cited By ~ 33

Author(s):

B. Kaczer ◽

H.-J. Im ◽

J. P. Pelz ◽

J. Chen ◽

W. J. Choyke

Keyword(s):

Band Structure ◽

Conduction Band ◽

Direct Observation ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

Download Full-text

Charge pumping current from single Si/SiO2interface traps: Direct observation ofPbcenters and fundamental trap-counting by the charge pumping method

Japanese Journal of Applied Physics ◽

10.7567/jjap.54.04dc01 ◽

2015 ◽

Vol 54 (4S) ◽

pp. 04DC01 ◽

Cited By ~ 7

Author(s):

Toshiaki Tsuchiya ◽

Yukinori Ono

Keyword(s):

Direct Observation ◽

Charge Pumping

Download Full-text

(Invited) Characterization of Individual Si/SiO2 Interface Traps: Direct Observation of Single P b0 Centers by the Charge Pumping (CP) Method and Correction of the Conventional CP Theory

ECS Meeting Abstracts ◽

10.1149/ma2015-02/29/1088 ◽

2015 ◽

Keyword(s):

Direct Observation ◽

Interface Traps ◽

Charge Pumping

Download Full-text

Evaluation of Accuracy of Charge Pumping Current in Time Domain

IEICE Transactions on Electronics ◽

10.1587/transele.e98.c.390 ◽

2015 ◽

Vol E98.C (5) ◽

pp. 390-394 ◽

Cited By ~ 3

Author(s):

Tokinobu WATANABE ◽

Masahiro HORI ◽

Taiki SARUWATARI ◽

Toshiaki TSUCHIYA ◽

Yukinori ONO

Keyword(s):

Time Domain ◽

Charge Pumping

Download Full-text