Temperature-dependent analysis of conduction mechanism of leakage current in thermally grown oxide on 4H-SiC
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1975 ◽
Vol 22
(6)
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pp. 2234-2239
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2015 ◽
Vol 276
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pp. 160-167
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2009 ◽
Vol 44
(7)
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pp. 1687-1703
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2018 ◽
Vol 57
(7S2)
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pp. 07MF01
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