scholarly journals Temperature-dependent analysis of conduction mechanism of leakage current in thermally grown oxide on 4H-SiC

2015 ◽  
Vol 117 (2) ◽  
pp. 024505 ◽  
Author(s):  
Mitsuru Sometani ◽  
Dai Okamoto ◽  
Shinsuke Harada ◽  
Hitoshi Ishimori ◽  
Shinji Takasu ◽  
...  
2006 ◽  
Vol 5 (5) ◽  
pp. 349-351 ◽  
Author(s):  
Boyd W. Veal ◽  
Arvydas P. Paulikas ◽  
Peggy Y. Hou

Sign in / Sign up

Export Citation Format

Share Document