Charge noise analysis of metal oxide semiconductor dual-gate Si/SiGe quantum point contacts
Keyword(s):
1995 ◽
Vol 34
(Part 2, No. 3A)
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pp. L285-L287
Keyword(s):
2000 ◽
Vol 39
(Part 1, No. 4B)
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pp. 2167-2171
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1998 ◽
Vol 37
(Part 1, No. 11)
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pp. 5926-5931
1997 ◽
Vol 36
(Part 1, No. 12B)
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pp. 7736-7740
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Keyword(s):
2005 ◽
Vol 44
(4B)
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pp. 2465-2468
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