Determining the crystalline degree of silicon nanoclusters/SiO2 multilayers by Raman scattering

2014 ◽  
Vol 115 (20) ◽  
pp. 203504 ◽  
Author(s):  
S. Hernández ◽  
J. López-Vidrier ◽  
L. López-Conesa ◽  
D. Hiller ◽  
S. Gutsch ◽  
...  
1983 ◽  
Vol 44 (11) ◽  
pp. 313-318 ◽  
Author(s):  
Masaaki Takashige ◽  
Terutaro Nakamura ◽  
Yutaka Aikawa

1981 ◽  
Vol 42 (C6) ◽  
pp. C6-350-C6-352 ◽  
Author(s):  
N. Wada ◽  
M. V. Klein ◽  
H. Zabel
Keyword(s):  

1981 ◽  
Vol 42 (C6) ◽  
pp. C6-54-C6-56 ◽  
Author(s):  
S. T. Kshirsagar ◽  
J. S. Lannin

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