scholarly journals Design and characterization of electron beam focusing for X-ray generation in novel medical imaging architecture

2014 ◽  
Vol 21 (5) ◽  
pp. 056702 ◽  
Author(s):  
V. Bogdan Neculaes ◽  
Yun Zou ◽  
Peter Zavodszky ◽  
Louis Inzinna ◽  
Xi Zhang ◽  
...  
Keyword(s):  
Electron Beam ◽  
Medical Imaging ◽  
X Ray ◽  
Beam Focusing

COMPOSITION AND NANOHARDNESS OF SiC FILMS DEPOSITED BY ELECTRON BEAM PHYSICAL VAPOR DEPOSITION

2009 ◽  
Vol 23 (06n07) ◽  
pp. 1910-1915 ◽  
Author(s):  
MIN TENG ◽  
XIAODONG HE ◽  
YUE SUN
Keyword(s):  
Electron Beam ◽  
Chemical Bonding ◽  
Vapor Deposition ◽  
Photoelectron Spectroscopy ◽  
Physical Vapor Deposition ◽  
Current Intensity ◽  
X Ray ◽  
Deposited Films ◽  
Sic Films

SiC films with a quantity of carbon and silicon were obtained by electron beam physical vapor deposition (EB-PVD) from a sintered SiC target with different current intensity of EB. The X-ray photoelectron spectroscopy (XPS) was used for characterization of chemical bonding states of C and Si elements in SiC films in order to study the influence of current intensity of EB on the compositions in the deposited films. At the same time, the nanohardness of the deposited films was investigated.

REALIZATION AND CHARACTERIZATION OF e-BEAM COMPLETELY EVAPORATED BSCCO THIN FILMS

1991 ◽  
Vol 05 (18) ◽  
pp. 1203-1211 ◽  
Author(s):  
C. ATTANASIO ◽  
L. MARITATO ◽  
A. NIGRO ◽  
S. PRISHEPA ◽  
R. SCAFURO
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Single Crystal ◽  
Critical Current ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
Reliable Technique ◽  
X Ray ◽  
Eds Analysis

BSCCO thin films with T c (R = 0) higher than 80 K have been routinely prepared using a simple and reliable technique in which we completely electron beam evaporated weighted amounts of bulk pellets. The films were grown on MgO single crystal (100) substrates and showed, after an ex-situ annealing at high temperatures (840–880° C) for several hours, a strong preferential orientation with the c-axis perpendicular to the plane of the substrate. The films were characterized by Θ − 2Θ X-ray diffraction and EDS analysis and by paraconductivity and critical current measurements.

Characterization of Nd:Y3Al5O12 Thin Films Prepared by Electron Beam Evaporation Deposition

2013 ◽  
Vol 320 ◽  
pp. 150-154
Author(s):  
Hao Ren ◽  
Qun Zeng ◽  
Xi Hui Liang
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Room Temperature ◽  
Electron Beam Evaporation ◽  
Photoluminescence Spectra ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surface Morphologies ◽  
Ingaas Detector

Nd:YAG thin films have been prepared on Si (100) substrates by electron beam evaporation deposition. The surface morphologies, crystalline phases and optical properties of the Nd:YAG thin films were characterized by x-ray diffraction, scanning electron microscopy, photoluminescence spectroscopy, and spectrophotometer. The crystallization of Nd:YAG thin films was improved after annealing at 1100 °C for 1 hour in vacuum. Excited by a Ti:sapphire laser at 808 nm, photoluminescence spectra of Nd:YAG thin films were measured at room temperature, and the transition of4F3/24I11/2of Nd3+in YAG in the region of 1064 nm were detected by a liquid nitrogen cooled InGaAs detector array.

Characterization of electron beam evaporated ZnS:Mn thin films by using particle induced x-ray emission analysis

1988 ◽  
Vol 33-34 ◽  
pp. 661-666 ◽  
Author(s):  
Heiji Uchiike ◽  
Shuji Hirao ◽  
Kunihiko Ohishi ◽  
Yoshifumi Fukushima
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Emission Analysis ◽  
X Ray

Synchrotron X-ray CT characterization of titanium parts fabricated by additive manufacturing. Part I. Morphology

2016 ◽  
Vol 23 (4) ◽  
pp. 1006-1014 ◽  
Author(s):  
Nicola Vivienne Yorke Scarlett ◽  
Peter Tyson ◽  
Darren Fraser ◽  
Sheridan Mayo ◽  
Anton Maksimenko
Keyword(s):  
Titanium Alloy ◽  
Electron Beam ◽  
Additive Manufacturing ◽  
Electron Beam Melting ◽  
Melting Process ◽  
Ti Alloy ◽  
X Ray ◽  
Electron Beam Melting Process ◽  
Powdered Titanium

Synchrotron X-ray tomography has been applied to the study of titanium parts fabricated by additive manufacturing (AM). The AM method employed here was the Arcam EBM®(electron beam melting) process which uses powdered titanium alloy, Ti64 (Ti alloy with approximately 6%Al and 4%V), as the feed and an electron beam for the sintering/welding. The experiment was conducted on the Imaging and Medical Beamline of the Australian Synchrotron. Samples were chosen to examine the effect of build direction and complexity of design on the surface morphology and final dimensions of the piece.

scholarly journals Research and development of an electron beam focusing system for a high-brightness X-ray generator

2010 ◽  
Vol 18 (1) ◽  
pp. 53-57 ◽  
Author(s):  
Takeshi Sakai ◽  
Satoshi Ohsawa ◽  
Noriyoshi Sakabe ◽  
Takashi Sugimura ◽  
Mitsuo Ikeda
Keyword(s):  
Electron Beam ◽  
Research And Development ◽  
High Brightness ◽  
X Ray ◽  
Beam Focusing
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