Quantitative in-situ scanning electron microscope pull-out experiments and molecular dynamics simulations of carbon nanotubes embedded in palladium

2014 ◽  
Vol 115 (14) ◽  
pp. 144301 ◽  
Author(s):  
S. Hartmann ◽  
T. Blaudeck ◽  
O. Hölck ◽  
S. Hermann ◽  
S. E. Schulz ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Molecular Dynamics ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Molecular Dynamics Simulations ◽  
Pull Out ◽  
Dynamics Simulations ◽  
Scanning Electron

Visualization and in situ contacting of carbon nanotubes in a scanning electron microscope

2005 ◽  
Vol 23 (6) ◽  
pp. 2789 ◽  
Author(s):  
M. D. Croitoru ◽  
G. Bertsche ◽  
D. P. Kern ◽  
C. Burkhardt ◽  
S. Bauerdick ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Scanning Electron

In Situ Scanning Electron Microscope Peeling To Quantify Surface Energy between Multiwalled Carbon Nanotubes and Graphene

ACS Nano ◽  
2014 ◽  
Vol 8 (1) ◽  
pp. 124-138 ◽  
Author(s):  
Michael R. Roenbeck ◽  
Xiaoding Wei ◽  
Allison M. Beese ◽  
Mohammad Naraghi ◽  
Al’ona Furmanchuk ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Surface Energy ◽  
Scanning Electron Microscope ◽  
Multiwalled Carbon Nanotubes ◽  
Multiwalled Carbon ◽  
Scanning Electron

Development of Hybrid MEMS/FIB Processes and Applications of Three-pronged Active Nanotweezers For Manipulation of Nano Objects

2006 ◽  
Vol 983 ◽  
Author(s):  
Xuefeng Wang ◽  
Chang Liu
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
In Situ Characterization ◽  
End Effectors ◽  
Scanning Electron

AbstractWe report recent development of a three-probe micromachined nanomanipulator for manipulation and in-situ characterization of nanomaterials in scanning electron microscope (SEM). The nanomanipulator consists of three independent probes having thermal bimetallic actuators and nanoscopic end-effectors. Nanoscale end-effectors with sub-100-nm spacing are created using focused ion beam (FIB) milling to directly interface with nanoscopic objects (e.g., nanotubes, nanowires). Handling of individual carbon nanotubes (CNTs) was successfully realized with the nanomanipulator in an SEM.

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