In Situ Scanning Electron Microscope Peeling To Quantify Surface Energy between Multiwalled Carbon Nanotubes and Graphene

ACS Nano ◽  
2014 ◽  
Vol 8 (1) ◽  
pp. 124-138 ◽  
Author(s):  
Michael R. Roenbeck ◽  
Xiaoding Wei ◽  
Allison M. Beese ◽  
Mohammad Naraghi ◽  
Al’ona Furmanchuk ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Surface Energy ◽  
Scanning Electron Microscope ◽  
Multiwalled Carbon Nanotubes ◽  
Multiwalled Carbon ◽  
Scanning Electron

scholarly journals Electron Beam Irradiation Induced Multiwalled Carbon Nanotubes Fusion inside SEM

Scanning ◽  
2017 ◽  
Vol 2017 ◽  
pp. 1-8 ◽  
Author(s):  
Daming Shen ◽  
Donglei Chen ◽  
Zhan Yang ◽  
Huicong Liu ◽  
Tao Chen ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Beam ◽  
Electron Microscope ◽  
Multiwalled Carbon Nanotubes ◽  
Electron Beam Irradiation ◽  
Tensile Force ◽  
Beam Irradiation ◽  
Multiwalled Carbon ◽  
Near Future ◽  
Scanning Electron

This paper reported a method of multiwalled carbon nanotubes (MWCNTs) fusion inside a scanning electron microscope (SEM). A CNT was picked up by nanorobotics manipulator system which was constructed in SEM with 21 DOFs and 1 nm resolution. The CNT was picked up and placed on two manipulators. The tensile force was 140 nN when the CNT was pulled into two parts. Then, two parts of the CNT were connected to each other by two manipulators. The adhered force between two parts was measured to be about 20 nN. When the two parts of CNT were connected again, the contact area was fused by focused electron beam irradiation for 3 minutes. The tensile force of the junction was measured to be about 100 nN. However, after fusion, the tensile force was five times larger than the tensile force connected only by van der Waals force. This force was 70 percent of the tensile force before pulling out of CNTs. The results revealed that the electron beam irradiation was a promising method for CNT fusion. We hope this technology will be applied to nanoelectronics in the near future.

Visualization and in situ contacting of carbon nanotubes in a scanning electron microscope

2005 ◽  
Vol 23 (6) ◽  
pp. 2789 ◽  
Author(s):  
M. D. Croitoru ◽  
G. Bertsche ◽  
D. P. Kern ◽  
C. Burkhardt ◽  
S. Bauerdick ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Scanning Electron

Development of Hybrid MEMS/FIB Processes and Applications of Three-pronged Active Nanotweezers For Manipulation of Nano Objects

2006 ◽  
Vol 983 ◽  
Author(s):  
Xuefeng Wang ◽  
Chang Liu
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
In Situ Characterization ◽  
End Effectors ◽  
Scanning Electron

AbstractWe report recent development of a three-probe micromachined nanomanipulator for manipulation and in-situ characterization of nanomaterials in scanning electron microscope (SEM). The nanomanipulator consists of three independent probes having thermal bimetallic actuators and nanoscopic end-effectors. Nanoscale end-effectors with sub-100-nm spacing are created using focused ion beam (FIB) milling to directly interface with nanoscopic objects (e.g., nanotubes, nanowires). Handling of individual carbon nanotubes (CNTs) was successfully realized with the nanomanipulator in an SEM.

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