Cross-talk artefacts in Kelvin probe force microscopy imaging: A comprehensive study

2014 ◽  
Vol 115 (14) ◽  
pp. 144313 ◽  
Author(s):  
S. Barbet ◽  
M. Popoff ◽  
H. Diesinger ◽  
D. Deresmes ◽  
D. Théron ◽  
...  
Keyword(s):  
Cross Talk ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Comprehensive Study

Kelvin Probe Force Microscopy Imaging Using Carbon Nanotube Probe

2001 ◽  
Vol 40 (Part 1, No. 6B) ◽  
pp. 4314-4316 ◽  
Author(s):  
Satoru Takahashi ◽  
Takayoshi Kishida ◽  
Seiji Akita ◽  
Yoshikazu Nakayama
Keyword(s):  
Carbon Nanotube ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Microscopy Imaging ◽  
Force Microscopy

New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors

2009 ◽  
Vol 103 (26) ◽  
Author(s):  
Sascha Sadewasser ◽  
Pavel Jelinek ◽  
Chung-Kai Fang ◽  
Oscar Custance ◽  
Yusaku Yamada ◽  
...  
Keyword(s):  
Frequency Modulation ◽  
Kelvin Probe Force Microscopy ◽  
Atomic Resolution ◽  
Kelvin Probe ◽  
Microscopy Imaging ◽  
Force Microscopy

High-Resolution Kelvin Probe Force Microscopy Imaging of Interface Dipoles and Photogenerated Charges in Organic Donor–Acceptor Photovoltaic Blends

ACS Nano ◽  
2016 ◽  
Vol 10 (1) ◽  
pp. 739-746 ◽  
Author(s):  
Franz Fuchs ◽  
Florent Caffy ◽  
Renaud Demadrille ◽  
Thierry Mélin ◽  
Benjamin Grévin
Keyword(s):  
High Resolution ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Donor Acceptor
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