High-Resolution Kelvin Probe Force Microscopy Imaging of Interface Dipoles and Photogenerated Charges in Organic Donor–Acceptor Photovoltaic Blends

ACS Nano ◽  
2016 ◽  
Vol 10 (1) ◽  
pp. 739-746 ◽  
Author(s):  
Franz Fuchs ◽  
Florent Caffy ◽  
Renaud Demadrille ◽  
Thierry Mélin ◽  
Benjamin Grévin
Keyword(s):  
High Resolution ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Donor Acceptor

Kelvin Probe Force Microscopy Imaging Using Carbon Nanotube Probe

2001 ◽  
Vol 40 (Part 1, No. 6B) ◽  
pp. 4314-4316 ◽  
Author(s):  
Satoru Takahashi ◽  
Takayoshi Kishida ◽  
Seiji Akita ◽  
Yoshikazu Nakayama
Keyword(s):  
Carbon Nanotube ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Microscopy Imaging ◽  
Force Microscopy

New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors

2009 ◽  
Vol 103 (26) ◽  
Author(s):  
Sascha Sadewasser ◽  
Pavel Jelinek ◽  
Chung-Kai Fang ◽  
Oscar Custance ◽  
Yusaku Yamada ◽  
...  
Keyword(s):  
Frequency Modulation ◽  
Kelvin Probe Force Microscopy ◽  
Atomic Resolution ◽  
Kelvin Probe ◽  
Microscopy Imaging ◽  
Force Microscopy

Cross-talk artefacts in Kelvin probe force microscopy imaging: A comprehensive study

2014 ◽  
Vol 115 (14) ◽  
pp. 144313 ◽  
Author(s):  
S. Barbet ◽  
M. Popoff ◽  
H. Diesinger ◽  
D. Deresmes ◽  
D. Théron ◽  
...  
Keyword(s):  
Cross Talk ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Comprehensive Study

scholarly journals High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads

2016 ◽  
Vol 7 ◽  
pp. 799-808 ◽  
Author(s):  
Benjamin Grévin ◽  
Pierre-Olivier Schwartz ◽  
Laure Biniek ◽  
Martin Brinkmann ◽  
Nicolas Leclerc ◽  
...  
Keyword(s):  
Indium Tin Oxide ◽  
Contact Potential Difference ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Structural Variations ◽  
Contact Potential ◽  
Force Microscopy ◽  
Donor Acceptor ◽  
Dark Conditions ◽  
Self Assembled

Self-assembled donor–acceptor dyads are used as model nanostructured heterojunctions for local investigations by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM). With the aim to probe the photo-induced charge carrier generation, thin films deposited on transparent indium tin oxide substrates are investigated in dark conditions and upon illumination. The topographic and contact potential difference (CPD) images taken under dark conditions are analysed in view of the results of complementary transmission electron microscopy (TEM) experiments. After in situ annealing, it is shown that the dyads with longer donor blocks essentially lead to standing acceptor–donor lamellae, where the acceptor and donor groups are π-stacked in an edge-on configuration. The existence of strong CPD and surface photo-voltage (SPV) contrasts shows that structural variations occur within the bulk of the edge-on stacks. SPV images with a very high lateral resolution are achieved, which allows for the resolution of local photo-charging contrasts at the scale of single edge-on lamella. This work paves the way for local investigations of the optoelectronic properties of donor–acceptor supramolecular architectures down to the elementary building block level.

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