Spectroscopic ellipsometry determination of the optical constants of titanium-doped WO3 films made by co-sputter deposition

2014 ◽  
Vol 115 (13) ◽  
pp. 133511 ◽  
Author(s):  
M. Vargas ◽  
E. J. Rubio ◽  
A. Gutierrez ◽  
C. V. Ramana
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Sputter Deposition

scholarly journals Determination of the Thickness and Optical Constants of ZrO2 by Spectroscopic Ellipsometry and Spectrophotometric Method

2011 ◽  
Vol 8 ◽  
pp. 223-227 ◽  
Author(s):  
R. Yusoh ◽  
M. Horprathum ◽  
P. Eiamchai ◽  
S. Chanyawadee ◽  
K. Aiempanakit
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Spectrophotometric Method ◽  
Optical Constants

Accurate Determination of Optical Constants of Amorphous Absorbing Thin Films by Spectroscopic Ellipsometry

2015 ◽  
Vol 35 (4) ◽  
pp. 0431001 ◽  
Author(s):  
李江 Li Jiang ◽  
李沛 Li Pei ◽  
黄峰 Huang Feng ◽  
魏贤华 Wei Xianhua ◽  
葛芳芳 Ge Fangfang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Accurate Determination

Determination of optical constants of Si/ZnO polycrystalline nanocomposites by spectroscopic ellipsometry

2001 ◽  
Vol 16 (12) ◽  
pp. 3554-3559 ◽  
Author(s):  
J. García-Serrano ◽  
N. Koshizaki ◽  
T. Sasaki ◽  
G. Martínez-Montes ◽  
U. Pal
Keyword(s):  
Film Thickness ◽  
Quartz Glass ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Composite Films ◽  
Two Phase ◽  
Glass Substrates ◽  
Optical Functions ◽  
Substrate Film

The optical constants of Si/ZnO composite films grown on quartz glass substrates were determined in the spectral range 1.5–5.0 eV by spectroscopic ellipsometry using a rotating-analyzer ellipsometer. The structure of the samples was modeled by a two-phase (substrate–film) model, and the optical functions of the film were parameterized through different effective medium approximations. The results allowed us to estimate the microstructural film parameters, such as film thickness, the volume fractions of each of the constituents, and optical constants.

Determination of optical constants of solgel-derived inhomogeneous TiO_2 thin films by spectroscopic ellipsometry and transmission spectroscopy

1998 ◽  
Vol 37 (4) ◽  
pp. 691 ◽  
Author(s):  
Md. Mosaddeq-ur-Rahman ◽  
Guolin Yu ◽  
Kalaga Murali Krishna ◽  
Tetsuo Soga ◽  
Junji Watanabe ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Transmission Spectroscopy

Determination of optical constants of Cd1−xZnxTe thin films by spectroscopic ellipsometry

2003 ◽  
Vol 424 (1) ◽  
pp. 66-69 ◽  
Author(s):  
K. Prabakar ◽  
M. Sridharan ◽  
Sa.K. Narayandass ◽  
D. Mangalaraj ◽  
Vishnu Gopal
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants
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