Determination of optical constants of sol-gel derived Zn0.9Mg0.1O films by spectroscopic ellipsometry with various models

2009 ◽  
Vol 41 (6) ◽  
pp. 502-507 ◽  
Author(s):  
Shenghong Yang ◽  
Ying Liu ◽  
Yueli Zhang ◽  
Dang Mo
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Sol Gel

scholarly journals Determination of the Thickness and Optical Constants of ZrO2 by Spectroscopic Ellipsometry and Spectrophotometric Method

2011 ◽  
Vol 8 ◽  
pp. 223-227 ◽  
Author(s):  
R. Yusoh ◽  
M. Horprathum ◽  
P. Eiamchai ◽  
S. Chanyawadee ◽  
K. Aiempanakit
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Spectrophotometric Method ◽  
Optical Constants

Determination of Thickness and Optical Constants of Sol-Gel Derived TiO2Films by Combined Analysis of Transmittance and X-Ray Reflectivity Spectra

2012 ◽  
Vol 32 (8) ◽  
pp. 0831001
Author(s):  
贾红宝 Jia Hongbao ◽  
孙菁华 Sun Jinghua ◽  
徐耀 Xu Yao ◽  
吴东 Wu Dong ◽  
吕海兵 Lü Haibing ◽  
...  
Keyword(s):  
Optical Constants ◽  
Sol Gel ◽  
Combined Analysis ◽  
X Ray ◽  
Reflectivity Spectra

Accurate Determination of Optical Constants of Amorphous Absorbing Thin Films by Spectroscopic Ellipsometry

2015 ◽  
Vol 35 (4) ◽  
pp. 0431001 ◽  
Author(s):  
李江 Li Jiang ◽  
李沛 Li Pei ◽  
黄峰 Huang Feng ◽  
魏贤华 Wei Xianhua ◽  
葛芳芳 Ge Fangfang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Accurate Determination

Determination of optical constants of Si/ZnO polycrystalline nanocomposites by spectroscopic ellipsometry

2001 ◽  
Vol 16 (12) ◽  
pp. 3554-3559 ◽  
Author(s):  
J. García-Serrano ◽  
N. Koshizaki ◽  
T. Sasaki ◽  
G. Martínez-Montes ◽  
U. Pal
Keyword(s):  
Film Thickness ◽  
Quartz Glass ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Composite Films ◽  
Two Phase ◽  
Glass Substrates ◽  
Optical Functions ◽  
Substrate Film

The optical constants of Si/ZnO composite films grown on quartz glass substrates were determined in the spectral range 1.5–5.0 eV by spectroscopic ellipsometry using a rotating-analyzer ellipsometer. The structure of the samples was modeled by a two-phase (substrate–film) model, and the optical functions of the film were parameterized through different effective medium approximations. The results allowed us to estimate the microstructural film parameters, such as film thickness, the volume fractions of each of the constituents, and optical constants.

Determination of optical constants of solgel-derived inhomogeneous TiO_2 thin films by spectroscopic ellipsometry and transmission spectroscopy

1998 ◽  
Vol 37 (4) ◽  
pp. 691 ◽  
Author(s):  
Md. Mosaddeq-ur-Rahman ◽  
Guolin Yu ◽  
Kalaga Murali Krishna ◽  
Tetsuo Soga ◽  
Junji Watanabe ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Transmission Spectroscopy

Determination of optical constants of Cd1−xZnxTe thin films by spectroscopic ellipsometry

2003 ◽  
Vol 424 (1) ◽  
pp. 66-69 ◽  
Author(s):  
K. Prabakar ◽  
M. Sridharan ◽  
Sa.K. Narayandass ◽  
D. Mangalaraj ◽  
Vishnu Gopal
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants
Sign in / Sign up

Export Citation Format

Share Document