A quantitative method for determination of carrier escape efficiency in GaN-based light-emitting diodes: A comparison of open- and short-circuit photoluminescence

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Yong-Hoon Cho
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Vol 20 (5) ◽  
pp. 205-217
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J Deforges ◽  
P Garcia ◽  
J Bastie ◽  
F Marandet ◽  
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...  

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The stacked Al/Ag in place of a Ag anode solves the severe short circuit issues in TEOLED on normal glass substrates.


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