Influence of substrate quality on structural properties of AlGaN/GaN superlattices grown by molecular beam epitaxy

2014 ◽  
Vol 115 (8) ◽  
pp. 083511 ◽  
Author(s):  
F. Schubert ◽  
U. Merkel ◽  
T. Mikolajick ◽  
S. Schmult
AIP Advances ◽  
2017 ◽  
Vol 7 (10) ◽  
pp. 105020 ◽  
Author(s):  
Z. P. Zhang ◽  
Y. X. Song ◽  
Y. Y. Li ◽  
X. Y. Wu ◽  
Z. Y. S. Zhu ◽  
...  

2016 ◽  
Vol 30 (20) ◽  
pp. 1650269 ◽  
Author(s):  
Thi Giang Le ◽  
Minh Tuan Dau

High-resolution transmission electron microscopy (HR-TEM) has been used to investigate the structural properties of GeMn/Ge nanocolumns multilayer samples grown on Ge(001) substrates by means of molecular beam epitaxy (MBE) system. Four bilayers with the spacer thickness in the range between 6 nm and 15 nm and 10 periods of bilayers of Ge[Formula: see text]Mn[Formula: see text]/Ge nanocolumn are presented. A simplified 2D model based on the theory of elastic constant interactions has been used to provide reasonable explanations to the vertical self-organization of GeMn nanocolumns in multilayers.


2006 ◽  
Vol 3 (4) ◽  
pp. 776-779 ◽  
Author(s):  
Kunio Ichino ◽  
Yasuharu Morimoto ◽  
Hiroshi Kobayashi

2009 ◽  
Vol 106 (11) ◽  
pp. 113533 ◽  
Author(s):  
M. A. Moram ◽  
Y. Zhang ◽  
T. B. Joyce ◽  
D. Holec ◽  
P. R. Chalker ◽  
...  

2015 ◽  
Vol 1131 ◽  
pp. 16-19
Author(s):  
Patchareewan Prongjit ◽  
Samatcha Vorathamrong ◽  
Somsak Panyakeow ◽  
Chiraporn Tongyam ◽  
Piyasan Prasertthdam ◽  
...  

The GaAs nanowires are grown on Si (111) substrates by Ga-assisted molecular beam epitaxy growth technique. The effect of SiO2 thickness on the structural properties of GaAs nanowires is investigated by Scanning Electron Microscope (SEM). The nucleation of GaAs nanowires related to the presence of a SiO2 layer previously coated on Si substrate. The results show that the density, length, and diameter of GaAs nanowires strongly depend on the oxidation time (or SiO2 thickness).


2003 ◽  
Vol 199 (2) ◽  
pp. 161-168 ◽  
Author(s):  
S. Colis ◽  
A. Dinia ◽  
C. Ulhaq-Bouillet ◽  
P. Panissod ◽  
C. Mény ◽  
...  

2016 ◽  
Vol 119 (16) ◽  
pp. 165303 ◽  
Author(s):  
Celso I. Fornari ◽  
Paulo H. O. Rappl ◽  
Sérgio L. Morelhão ◽  
Eduardo Abramof

2006 ◽  
Vol 89 (26) ◽  
pp. 262903 ◽  
Author(s):  
O. Maksimov ◽  
V. D. Heydemann ◽  
P. Fisher ◽  
M. Skowronski ◽  
P. A. Salvador

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