Enhanced x-ray emissions from Au-Gd mixture targets ablated by a high-power nanosecond laser

2014 ◽  
Vol 115 (4) ◽  
pp. 043305 ◽  
Author(s):  
Yunsong Dong ◽  
Wanli Shang ◽  
Jiamin Yang ◽  
Lu Zhang ◽  
Wenhai Zhang ◽  
...  
Keyword(s):  
2010 ◽  
Vol 208 ◽  
pp. 012093
Author(s):  
S Chaurasia ◽  
D S Munda ◽  
S Tripathi ◽  
M Kumar ◽  
N K Gupta ◽  
...  

2020 ◽  
Vol 10 (7) ◽  
pp. 2224 ◽  
Author(s):  
Yuichi Inubushi ◽  
Toshinori Yabuuchi ◽  
Tadashi Togashi ◽  
Keiichi Sueda ◽  
Kohei Miyanishi ◽  
...  

We developed an experimental platform for combinative use of an X-ray free electron laser (XFEL) and a high-power nanosecond laser. The main target of the platform is an investigation of matter under high-pressure states produced by a laser-shock compression. In this paper, we show details of the experimental platform, including XFEL parameters and the focusing optics, the laser irradiation system and X-ray diagnostics. As a demonstration of the high-power laser-pump XFEL-probe experiment, we performed an X-ray diffraction measurement. An in-situ single-shot X-ray diffraction pattern expands to a large angle side, which shows a corundum was compressed by laser irradiation.


2017 ◽  
Vol 7 (7) ◽  
pp. 671 ◽  
Author(s):  
Toshiaki Inada ◽  
Takayuki Yamazaki ◽  
Tomohiro Yamaji ◽  
Yudai Seino ◽  
Xing Fan ◽  
...  

2021 ◽  
Vol 79 (6) ◽  
pp. 631-640
Author(s):  
Takaaki Tsunoda ◽  
Takeo Tsukamoto ◽  
Yoichi Ando ◽  
Yasuhiro Hamamoto ◽  
Yoichi Ikarashi ◽  
...  

Electronic devices such as medical instruments implanted in the human body and electronic control units installed in automobiles have a large impact on human life. The electronic circuits in these devices require highly reliable operation. Radiographic testing has recently been in strong demand as a nondestructive way to help ensure high reliability. Companies that use high-density micrometer-scale circuits or lithium-ion batteries require high speed and high magnification inspection of all parts. The authors have developed a new X-ray source supporting these requirements. The X-ray source has a sealed tube with a transmissive target on a diamond window that offers advantages over X-ray sources having a sealed tube with a reflective target. The X-ray source provides high-power-density X-ray with no anode degradation and a longer shelf life. In this paper, the authors will summarize X-ray source classification relevant to electronic device inspection and will detail X-ray source performance requirements and challenges. The paper will also elaborate on technologies employed in the X-ray source including tube design implementations for high-power-density X-ray, high resolution, and high magnification simultaneously; reduced system downtime for automated X-ray inspection; and reduced dosages utilizing quick X-ray on-and-off emission control for protection of sensitive electronic devices.


2021 ◽  
Vol 47 (7) ◽  
pp. 669-703
Author(s):  
V. V. Aleksandrov ◽  
M. M. Basko ◽  
A. V. Branitskii ◽  
E. V. Grabovsky ◽  
A. N. Gritsuk ◽  
...  
Keyword(s):  

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