scholarly journals Development of an Experimental Platform for Combinative Use of an XFEL and a High-Power Nanosecond Laser

2020 ◽  
Vol 10 (7) ◽  
pp. 2224 ◽  
Author(s):  
Yuichi Inubushi ◽  
Toshinori Yabuuchi ◽  
Tadashi Togashi ◽  
Keiichi Sueda ◽  
Kohei Miyanishi ◽  
...  
Keyword(s):  
Laser Irradiation ◽  
High Power ◽  
Large Angle ◽  
Nanosecond Laser ◽  
Diffraction Measurement ◽  
Single Shot ◽  
X Ray Diffraction ◽  
X Ray ◽  
Experimental Platform

We developed an experimental platform for combinative use of an X-ray free electron laser (XFEL) and a high-power nanosecond laser. The main target of the platform is an investigation of matter under high-pressure states produced by a laser-shock compression. In this paper, we show details of the experimental platform, including XFEL parameters and the focusing optics, the laser irradiation system and X-ray diagnostics. As a demonstration of the high-power laser-pump XFEL-probe experiment, we performed an X-ray diffraction measurement. An in-situ single-shot X-ray diffraction pattern expands to a large angle side, which shows a corundum was compressed by laser irradiation.

Photoluminescence Enhancement of CdS Nanocrystals Fabricated on Dithiocarbamate Functionalized PET Substrates

2012 ◽  
Vol 512-515 ◽  
pp. 1511-1515
Author(s):  
Chun Lin Zhao ◽  
Li Xing ◽  
Xiao Hong Liang ◽  
Jun Hui Xiang ◽  
Fu Shi Zhang ◽  
...  
Keyword(s):  
Room Temperature ◽  
Hexagonal Structure ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Visible Absorption ◽  
X Ray ◽  
Cds Nanocrystals ◽  
Morphological Studies ◽  
Transmission Electron

Cadmium sulfide (CdS) nanocrystals (NCs) were self-assembled and in-situ immobilized on the dithiocarbamate (DTCs)-functionalized polyethylene glycol terephthalate (PET) substrates between the organic (carbon disulfide diffused in n-hexane) –aqueous (ethylenediamine and Cd2+ dissolved in water) interface at room temperature. Powder X-ray diffraction measurement revealed the hexagonal structure of CdS nanocrystals. Morphological studies performed by scanning electron microscopy (SEM) and high-resolution transmission electron microscope (HRTEM) showed the island-like structure of CdS nanocrystals on PET substrates, as well as energy-dispersive X-ray spectroscopy (EDS) confirmed the stoichiometries of CdS nanocrystals. The optical properties of DTCs modified CdS nanocrystals were thoroughly investigated by ultraviolet-visible absorption spectroscopy (UV-vis) and fluorescence spectroscopy. The as-prepared DTCs present intrinsic hydrophobicity and strong affinity for CdS nanocrystals.

scholarly journals In-Situ X-ray Diffraction Measurement for Pure Niobium Metal in High Temperature Hydrogen Atmosphere

2006 ◽  
Vol 70 (6) ◽  
pp. 467-472 ◽  
Author(s):  
Tomonori Nambu ◽  
Nobue Shimizu ◽  
Hisakazu Ezaki ◽  
Hiroshi Yukawa ◽  
Masahiko Morinaga ◽  
...  
Keyword(s):  
High Temperature ◽  
Hydrogen Atmosphere ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Pure Niobium

scholarly journals X-Ray Single Crystal Structural Analysis of Magnetically Oriented Microcrystals

2014 ◽  
Vol 70 (a1) ◽  
pp. C1138-C1138
Author(s):  
Chiaki Tsuboi ◽  
Kazuki Aburaya ◽  
Shingo Higuchi ◽  
Fumiko Kimura ◽  
Masataka Maeyama ◽  
...  
Keyword(s):  
Molecular Structure ◽  
Crystal Structure ◽  
Single Crystal ◽  
Three Dimensional ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Data Set ◽  
Uv Curable ◽  
X Ray

We have developed magnetically oriented microcrystal array (MOMA) technique that enables single crystal X-ray diffraction analyses from microcrystalline powder. In this method, microcrystals suspended in a UV-curable monomer matrix are there-dimensionally aligned by special rotating magnetic field, followed by consolidation of the matrix by photopolymerization. From thus achieved MOMAs, we have been succeeded in crystal structure analysis for some substances [1, 2]. Though MOMA method is an effective technique, it has some problems as follows: in a MOMA, the alignment is deteriorated during the consolidation process. In addition, the sample microcrystals cannot be recovered from a MOMA. To overcome these problems, we performed an in-situ X-ray diffraction measurement using a three-dimensional magnetically oriented microcrystal suspension (3D MOMS) of L-alanine. An experimental setting of the in-situ X-ray measurement of MOMS is schematically shown in the figure. L-alanine microcrystal suspension was poured into a glass capillary and placed on the rotating unit equipped with a pair of neodymium magnets. Rotating X-ray chopper with 10°-slits was placed between the collimator and the suspension. By using this chopper, it was possible to expose the X-ray only when the rotating MOMS makes a specific direction with respect to the impinging X-ray. This has the same effect as the omega oscillation in conventional single crystal measurement. A total of 22 XRD images of 10° increments from 0° to 220° were obtained. The data set was processed by using conventional software to obtain three-dimensional molecular structure of L-alanine. The structure is in good agreement with that reported for the single crystal. R1 and wR2 were 6.53 and 17.4 %, respectively. RMSD value between the determined molecular structure and the reported one was 0.0045 Å. From this result, we conclude that this method can be effective and practical to be used widely for crystal structure analyses.

scholarly journals Ethylammonium Lead Iodide Formation in MAPbI3 Precursor Solutions by DMF Decomposition and Organic Cation Exchange Reaction

Crystals ◽  
2020 ◽  
Vol 10 (3) ◽  
pp. 162
Author(s):  
Ryan Taoran Wang ◽  
Elton Enchong Liu ◽  
Alex Fan Xu ◽  
Lory Wenjuan Yang ◽  
Jason Yuanzhe Chen ◽  
...  
Keyword(s):  
Cation Exchange ◽  
Exchange Reaction ◽  
Organic Cation ◽  
Annealing Process ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Lead Iodide ◽  
X Ray ◽  
Cation Exchange Reaction

Extra peaks have constantly been observed in the X-ray diffraction measurement for the CH3NH3PbI3 film. Such mysteries have now been uncovered in this paper, in which powder X-ray diffraction, in situ X-ray diffraction, and scanning electron microscopy measurements were conducted, and these peaks were attributed to the ethylammonium lead iodide (CH3CH2NH3PbI3/EAPbI3). It was found that the formation of EAPbI3 was triggered by the breakdown of N, N-dimethylformamide (DMF), which was adopted as the solvent in the preparation of the precursor solutions. EAPbI3 was generated by the organic cation exchange reaction in the subsequent annealing process. A simple solution for this problem is proposed in this paper as well, which would hopefully help the community to eradicate this impurity.

Stress in Ag/Ni Multilayers: A Comparison of Specimen-Curvature and X-Ray Diffraction Methods

1997 ◽  
Vol 472 ◽  
Author(s):  
P. Gergaud ◽  
S. Labat ◽  
H. Yang ◽  
A. Bottger ◽  
P. SandstrÖm ◽  
...  
Keyword(s):  
Laser Scanning ◽  
Intrinsic Stress ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Scanning Method ◽  
X Ray ◽  
Integrated Devices ◽  
Curvature Measurement ◽  
Very High

ABSTRACTMultilayers and superlattices are of great industrial interest because of their specific properties (magnetic, electronic, tribological…). Multilayers stacking are often in a very high state of intrinsic stress (some GPa) and for reliable integrated devices to be made it is capital to control and understand these intrinsic as well as extrinsic stresses. The objective of the present work is therefore the understanding of the origin of stresses and strains in multilayered metallic materials. Of course, a comparison of the different techniques which can be used for stress determination is a necessary first step of this study. In this aim, we have studied Ag/Ni multilayers, Ag and Ni thin films and Ag/Ni bilayers obtained by sputtering. The stresses have been determined via curvature measurement using both a laser scanning method and X-ray diffraction rocking curves technique, and via X-ray diffraction measurement of several d-spacings which act as in-situ strain gauges (also called the sin2ψ method and related methods). The obtained results from these different techniques are discussed in terms of accuracy, reproducibility and advantages / drawbacks. The obtained stresses from these methods cannot be directly compared and a specific discussion is developed around the relation between the measured strains and stresses and the microstructure of the materials.

In Situ Synchrotron X-ray Diffraction Measurement of the Strain Distribution in Si Die for the Embedded Substrates

2015 ◽  
Vol 44 (10) ◽  
pp. 3942-3947
Author(s):  
Hsueh Hsien Hsu ◽  
Hao Chen ◽  
Yao Tsung Ouyang ◽  
Tz Cheng Chiu ◽  
Tao Chih Chang ◽  
...  
Keyword(s):  
Strain Distribution ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray

In-situ synchrotron X-ray diffraction measurement of epitaxial FeRh thin films

2010 ◽  
Author(s):  
Sung-Uk Jang ◽  
Seungmin Hyun ◽  
Hwan Soo Lee ◽  
Soon-Ju Kwon ◽  
Ji-Hong Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray
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