Microwave noise characterization of graphene field effect transistors

M. Tanzid; M. A. Andersson; J. Sun; J. Stake

doi:10.1063/1.4861115

Microwave noise characterization of graphene field effect transistors

Applied Physics Letters ◽

10.1063/1.4861115 ◽

2014 ◽

Vol 104 (1) ◽

pp. 013502 ◽

Cited By ~ 21

Author(s):

M. Tanzid ◽

M. A. Andersson ◽

J. Sun ◽

J. Stake

Keyword(s):

Field Effect ◽

Field Effect Transistors ◽

Noise Characterization ◽

Microwave Noise

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1/ f Noise Characterization of Bilayer MoS 2 Field‐Effect Transistors on Paper with Inkjet‐Printed Contacts and hBN Dielectrics

Advanced Electronic Materials ◽

10.1002/aelm.202100283 ◽

2021 ◽

pp. 2100283

Author(s):

Lorenzo Pimpolari ◽

Gabriele Calabrese ◽

Silvia Conti ◽

Robyn Worsley ◽

Subimal Majee ◽

...

Keyword(s):

Field Effect ◽

Field Effect Transistors ◽

Noise Characterization

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High-frequency noise characterization of graphene field effect transistors on SiC substrates

Applied Physics Letters ◽

10.1063/1.4994324 ◽

2017 ◽

Vol 111 (3) ◽

pp. 033502 ◽

Cited By ~ 4

Author(s):

C. Yu ◽

Z. Z. He ◽

X. B. Song ◽

Q. B. Liu ◽

S. B. Dun ◽

...

Keyword(s):

High Frequency ◽

Field Effect ◽

Field Effect Transistors ◽

Frequency Noise ◽

High Frequency Noise ◽

Noise Characterization

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Publisher’s Note: “High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors” [Rev. Sci. Instrum. 87, 044702 (2016)]

Review of Scientific Instruments ◽

10.1063/1.4950949 ◽

2016 ◽

Vol 87 (5) ◽

pp. 059902

Author(s):

G. Giusi ◽

O. Giordano ◽

G. Scandurra ◽

M. Rapisarda ◽

S. Calvi ◽

...

Keyword(s):

Direct Current ◽

Field Effect ◽

Field Effect Transistors ◽

Low Frequency ◽

High Sensitivity ◽

Frequency Noise ◽

Sensitivity Measurement ◽

Capacitance Voltage ◽

Noise Characterization

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High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors

Review of Scientific Instruments ◽

10.1063/1.4945263 ◽

2016 ◽

Vol 87 (4) ◽

pp. 044702 ◽

Cited By ~ 7

Author(s):

G. Giusi ◽

O. Giordano ◽

G. Scandurra ◽

M. Rapisarda ◽

S. Calvi ◽

...

Keyword(s):

Direct Current ◽

Field Effect ◽

Field Effect Transistors ◽

Low Frequency ◽

High Sensitivity ◽

Frequency Noise ◽

Sensitivity Measurement ◽

Capacitance Voltage ◽

Noise Characterization

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Electrical characterization of back-gated and top-gated germanium-core/silicon-shell nanowire field-effect transistors

2016 IEEE Silicon Nanoelectronics Workshop (SNW) ◽

10.1109/snw.2016.7578010 ◽

2016 ◽

Author(s):

Marolop Simanullang ◽

Gde B. M. Wisna ◽

Wei Cao ◽

Koichi Usami ◽

Kaustav Banerjee ◽

...

Keyword(s):

Field Effect ◽

Field Effect Transistors ◽

Electrical Characterization

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Fabrication and Characterization of GaN-based Nanostructure Field Effect Transistors

Solid-State Electronics ◽

10.1016/j.sse.2021.108079 ◽

2021 ◽

pp. 108079

Author(s):

Dong-Hyeok Son ◽

Terirama Thingujam ◽

Quan Dai ◽

Jeong-Gil Kim ◽

Sorin Cristoloveanu ◽

...

Keyword(s):

Field Effect ◽

Field Effect Transistors ◽

Fabrication And Characterization

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Synthesis and Characterization of Diperfluorooctyl-Substituted Phenylene−Thiophene Oligomers as n-Type Semiconductors. Molecular Structure−Film Microstructure−Mobility Relationships, Organic Field-Effect Transistors, and Transistor Nonvolatile Memory Elements

Chemistry of Materials ◽

10.1021/cm0495008 ◽

2004 ◽

Vol 16 (23) ◽

pp. 4715-4727 ◽

Cited By ~ 103

Author(s):

Antonio Facchetti ◽

Joseph Letizia ◽

Myung-Han Yoon ◽

Melissa Mushrush ◽

Howard E. Katz ◽

...

Keyword(s):

Molecular Structure ◽

Nonvolatile Memory ◽

Field Effect ◽

Field Effect Transistors ◽

Synthesis And Characterization ◽

Organic Field Effect Transistors ◽

Film Microstructure

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Fabrication and Characterization of 1700 V 4H-SiC Vertical Double-Implanted Metal-Oxide-Semiconductor Field-Effect Transistors

Chinese Physics Letters ◽

10.1088/0256-307x/32/12/127101 ◽

2015 ◽

Vol 32 (12) ◽

pp. 127101 ◽

Cited By ~ 1

Author(s):

Hua-Jun Shen ◽

Ya-Chao Tang ◽

Zhao-Yang Peng ◽

Xiao-Chuan Deng ◽

Yun Bai ◽

...

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Fabrication And Characterization

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Electrical characterization of back-gated bi-layer MoS2 field-effect transistors and the effect of ambient on their performances

Applied Physics Letters ◽

10.1063/1.3696045 ◽

2012 ◽

Vol 100 (12) ◽

pp. 123104 ◽

Cited By ~ 385

Keyword(s):

Field Effect ◽

Field Effect Transistors ◽

Electrical Characterization

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Modeling and characterization of photovoltaic and photoconductive effects in insulated-gate field effect transistors under optical excitation

Solid-State Electronics ◽

10.1016/j.sse.2021.108139 ◽

2021 ◽

pp. 108139

Author(s):

Han Bin Yoo ◽

Haesung Kim ◽

Ji Hee Ryu ◽

Jingyu Park ◽

Jong-Ho Bae ◽

...

Keyword(s):

Field Effect ◽

Field Effect Transistors ◽

Optical Excitation

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