High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors
2016 ◽
Vol 87
(4)
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pp. 044702
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2012 ◽
Vol 51
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pp. 06FE18
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2012 ◽
Vol 51
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pp. 06FE18
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2011 ◽
Vol 50
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pp. 06GF18
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2012 ◽
Vol 33
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pp. 1348-1350
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2008 ◽
Vol 40
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pp. 2147-2149
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2011 ◽
Vol 50
(6S)
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pp. 06GF18
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